Display Panel Wiring Arrangement for Aperture Ratio
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Solution Overview
Problem
The challenge in improving the aperture ratio of display devices lies in reducing the black matrix area while maintaining contrast ratio and preventing color-mixing, which is limited by conventional transistor and wiring designs.
Innovation Solution
The aperture ratio is enhanced by adjusting the wiring arrangement and structure of the array substrate, including the placement and overlap of scan lines, data lines, and pixel electrodes, along with the use of black matrix layers to minimize the total area of black matrix coverage, thereby optimizing the display panel's design.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of moving object
If the black matrix area is reduced to improve aperture ratio, then the aperture ratio is improved, but color-mixing increases and contrast ratio deteriorates
Solution Approach 1:
The patent segments the black matrix coverage by selectively positioning scan lines and contact vias. The first scan line is positioned to overlap with the semiconductor layer and first contact via, while the second scan line overlaps with the second contact via. This segmentation allows different regions to have different black matrix coverage, reducing the total black matrix area while maintaining color separation where needed.
Solution Approach 2:
The patent applies local quality by varying the black matrix coverage in different regions of the pixel electrode. The first and second contact vias are positioned at different locations relative to the scan lines, creating localized regions with different optical properties. This allows the aperture ratio to be increased in certain areas while maintaining adequate black matrix coverage in other areas to prevent color-mixing.
2Area of moving object
If the black matrix area is reduced to improve aperture ratio, then the aperture ratio is improved, but the contrast ratio deteriorates
Solution Approach 1:
The patent segments the scan line positioning to optimize both aperture ratio and contrast ratio. The first scan line is positioned to overlap with the semiconductor layer and first contact via, while the second scan line is positioned to overlap with the second contact via. This segmentation creates distinct regions that can be optimized for different performance metrics, allowing the aperture ratio to be increased while maintaining adequate black matrix coverage for contrast ratio.
3Area of moving object
If conventional transistor and wiring designs are used, then manufacturing is simplified, but the aperture ratio cannot be improved beyond certain limits
Solution Approach 1:
The patent resolves the contradiction by transitioning from a conventional planar wiring arrangement to a multi-layer stacked configuration. The first and second contact vias are positioned at different vertical layers, with the first contact via overlapping the first scan line and the second contact via overlapping the second scan line. This dimensional change allows for more flexible wiring arrangements that can achieve higher aperture ratios without excessive complexity.
Data Source
AI summary
A display panel is disclosed, which comprises a first substrate including: a base substrate; a semiconductor layer; a first insulating layer; a first scan line and a second scan line extended along a first direction respectively and portions of the first scan line and the second scan line overlapping with the semiconductor layer; a second insulating layer; a data line extended along a second direction and electrically connecting to the semiconductor layer through a first contact via, wherein the second direction is different from the first direction; and a first metal pad and a second metal pad electrically connecting to the semiconductor layer through two second contact vias respectively; wherein the first contact via and the two second contact vias are disposed between the first scan line and the second scan line.