Display Device Pattern Inspection With Diagonal Grayscale Compensation
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Solution Overview
Problem
Existing display device manufacturing processes fail to detect defects in display panels early, leading to potential deterioration in display performance.
Innovation Solution
A method of testing display devices by photographing a target substrate, obtaining grayscale values, and comparing these values with adjacent patterns to determine defects through compensated comparison values, improving defect detection accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If grayscale comparison is performed only with vertically adjacent patterns, then the inspection process is simple, but defect detection accuracy is insufficient due to lack of compensation for diagonal variations
Solution Approach 1:
The inspection process is segmented into multiple comparison stages: first comparing the inspection target pattern with vertically adjacent patterns to obtain a first comparison value, then comparing with diagonally adjacent patterns to obtain a second comparison value. This segmentation allows systematic compensation of grayscale variations while maintaining organized processing flow.
Solution Approach 2:
The inspection approach transitions from one-dimensional vertical comparison to two-dimensional comparison by incorporating diagonal directions. The diagonal comparison dimension compensates for grayscale variations that occur along diagonal transitions, thereby improving detection accuracy without excessive complexity increase.
2Measurement precision
If multiple comparison directions are used to improve defect detection, then detection accuracy improves, but processing time and computational load increase
Solution Approach 1:
Grayscale values for all patterns including vertically and diagonally adjacent patterns are obtained in advance through photographing and grayscaling operations. This preliminary acquisition of data allows subsequent comparison operations to proceed efficiently without repeated measurement delays.
Solution Approach 2:
The system uses the grayscale values of adjacent patterns as reference standards for self-comparison with the inspection target pattern. This self-service comparison mechanism eliminates the need for external calibration standards or additional reference measurements, reducing processing overhead.
Data Source
AI summary
A method of testing a display device includes obtaining a photographed image by photographing a target substrate, where the target substrate includes patterns arranged in a first direction and a second direction, obtaining grayscale values of the patterns by grayscaling the photographed image, determining an inspection target pattern from among the patterns, obtaining a first comparison value by comparing a grayscale value of the inspection target pattern with a grayscale value of a first vertically adjacent pattern adjacent in the first direction, obtaining a second comparison value by comparing the grayscale value of the inspection target pattern with a grayscale value of a first diagonally adjacent pattern adjacent in a third direction crossing the first and second directions, obtaining a compensated comparison value by compensating the first comparison value based on the second comparison value, and determining a defect of the inspection target pattern based on the compensated comparison value.