Display Perimeter Outline Detection for Edge Defect Screening
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Solution Overview
Problem
Current image processing technologies fail to detect edge defects in electronic device displays, leading to defective devices being passed to end customers due to misinterpretation of new edges formed by defects as actual edges.
Innovation Solution
A method and system for edge defect detection on electronic device displays involving displaying an outline of a contrasting color on the perimeter, capturing a digital image, and analyzing it using algorithms like A* search to identify continuous paths of the outlined color, determining defects based on the absence of such paths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If current image processing technology searches for straight edges on the display, then the processing is simple and fast, but defects are missed because new edges formed by defects are misinterpreted as actual edges
Solution Approach 1:
The patent applies preliminary action by displaying a test pattern (outline tracing the display perimeter) before performing the actual defect detection. This test pattern is specifically designed to highlight edge continuity, allowing the system to pre-identify expected edge locations and compare them against actual captured images, thereby improving defect detection accuracy without overly complicating the processing.
Solution Approach 2:
The patent introduces an intermediary element - a test pattern consisting of a colored outline that traces the display perimeter. This intermediary serves as a reference standard that mediates between the display being tested and the image processing algorithm. By comparing the captured image against this known test pattern, the system can reliably detect deviations indicating defects without requiring complex edge detection algorithms.
2Reliability
If the system uses simple edge detection algorithms, then the processing speed is fast, but defective devices are passed to customers due to missed defects
Solution Approach 1:
The test pattern is displayed and captured in advance, creating a reference image that encodes the expected perfect display perimeter. This preliminary capture allows the actual defect detection to proceed by simple comparison rather than complex analysis, maintaining fast processing speed while improving reliability.
Solution Approach 2:
The patent utilizes color changes by displaying a test pattern with a specific color (e.g., green outline) that contrasts with the display background. This color differentiation makes edge detection more reliable through simple color-based segmentation rather than complex grayscale analysis, achieving both high reliability and fast processing.
Data Source
AI summary
Systems and methods for defect detection on displays are disclosed according to various embodiments. In one example, a disclosed method for detecting defects on an electronic device display comprises connecting an electronic device to a server computer having a processor and a non-transitory computer readable storage medium storing test software for testing the electronic device display. The method further comprises displaying an outline on the electronic device display, where the outline traces a perimeter of the electronic device display, and where the outline comprises pixels of a first color. The first color differs from a color of a pixel that is not on the perimeter of the electronic device display. The method further comprises capturing a digital image of the electronic device while the electronic device is displaying the outline, transmitting the digital image to the server computer, and analyzing the digital image at the server computer.