Display Peripheral Testing Circuit Layout Optimization
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Solution Overview
Problem
In the manufacturing of high-resolution products, the limited layout space in the peripheral area of the substrate makes it difficult to design effective testing circuits for the display area, leading to poor production yields.
Innovation Solution
The electronic device incorporates multiple testing circuit areas in the peripheral area, with first and second switching elements arranged along different directions, allowing for effective testing functions of the display area, including array and light-on testing circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If testing circuit is designed in the peripheral area of high-resolution product, then testing function can be provided, but the layout space is limited leading to poor production yields
Solution Approach 1:
The testing circuit is divided into multiple independent testing circuit areas (first testing circuit area, second testing circuit area, etc.) disposed in different regions of the peripheral area. Each testing circuit area contains specific testing circuits that can independently test different portions of the display area, thereby distributing the space requirements across multiple segments rather than requiring a single large continuous area.
Solution Approach 2:
The patent utilizes both horizontal and vertical dimensions in the peripheral area by arranging testing circuit areas in different orientations. The first testing circuit area extends in a first direction while the second testing circuit area extends in a second direction different from the first, effectively using two-dimensional space optimization to maximize the utilization of limited peripheral area.
2Reliability
If multiple testing circuit areas are disposed in peripheral area, then effective testing functions are achieved, but device complexity increases
Solution Approach 1:
Multiple testing circuit areas are designed with similar functional structures, where each testing circuit area can perform comprehensive testing of the display area. The testing circuits in different areas share common functional capabilities (such as array testing, light-on testing), allowing the system to achieve enhanced reliability through redundancy rather than through fundamentally different complex mechanisms.
Solution Approach 2:
Each testing circuit area is designed with specialized characteristics suited to its location and function. The first testing circuit area and second testing circuit area may have different orientations and configurations optimized for their respective positions in the peripheral area, while maintaining overall functional consistency. This allows local optimization without requiring complete redesign of the entire testing system.
Data Source
AI summary
The disclosure provides an electronic device. The electronic device has a display area and a peripheral area. The peripheral area is adjacent to the display area. The peripheral area includes a first testing circuit area and a second testing circuit area. The first testing circuit area includes multiple first switching elements. The multiple first switching elements are arranged along a first direction. The second testing circuit area is adjacent to the first testing circuit area. The second testing circuit area includes multiple second switching elements. The multiple second switching elements are arranged along a second direction. The first direction is different from the second direction. The electronic device according to the disclosure can realize effective display area testing.