Display Pixel Inspection for Series Light-Emitting Elements
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Solution Overview
Problem
Existing display devices face challenges in detecting connection failures of light emitting elements connected in series, which can lead to non-emission of pixels and inefficient power consumption.
Innovation Solution
A method and structure for inspecting connection failures in series-connected light emitting elements using transistors and control signals, including initialization and lighting inspection power sources, to determine normal or abnormal connections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If light emitting elements are connected in series to reduce power consumption, then power consumption is reduced, but connection failure detection becomes difficult
Solution Approach 1:
The patent divides the series-connected light emitting elements into individual inspection units by introducing separate transistors (first transistor and second transistor) for each element. This segmentation allows independent control and inspection of each light emitting element's connection state, making it possible to detect connection failures in series-connected elements without changing the series connection structure itself.
Solution Approach 2:
The patent introduces transistors as intermediary components between the light emitting elements and the power source/inspection circuitry. These transistors act as mediators that enable individual control and inspection of each series-connected light emitting element, allowing connection failure detection while maintaining the series connection configuration that reduces power consumption.
2Measurement precision
If transistors are added to detect connection failures of each light emitting element, then connection failure detection capability is improved, but device complexity increases
Solution Approach 1:
The patent designs the transistors to serve multiple functions: the first transistor controls power supply to the light emitting element during normal operation and also serves as an inspection switch during connection failure detection. The second transistor similarly functions both as a control element and an inspection component. This multi-functionality reduces the need for separate dedicated inspection components, thereby limiting the increase in device complexity.
3Measurement precision
If inspection circuits are integrated into each pixel to enable connection failure detection, then detection accuracy is improved, but manufacturing complexity increases
Solution Approach 1:
The patent merges the inspection circuit components (transistors, control lines, power source connections) directly into the existing pixel structure. The first and second transistors are integrated within each pixel, sharing the same substrate and fabrication process as other pixel components. This merging approach enables connection failure detection at the pixel level without requiring separate manufacturing processes or additional complex assembly steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Accurately detects and addresses connection failures in series-connected light emitting elements, improving the reliability and uniformity of display device performance.
Implementation Method 1
The light emitting element emits light having a luminance (e.g., a set or predetermined luminance) corresponding to the amount of current supplied from the driving transistor
Data Source
AI summary
A display device inspection method includes: checking connection failures of light emitting elements included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power source, wherein the pixel comprises: a pixel circuit controlling a current flowing from a first power source to a second node in response to a voltage of a first node; a first light emitting element connected to the second node; a first transistor controlling the voltage of the initialization power source supplied to the second node; a second light emitting element electrically connected between the first light emitting element and a second power source; and a second transistor having a first electrode connected to a third node between the first light emitting element and the second light emitting element, and a gate electrode connected to a first inspection control line.