Display Pixel Inspection for Defect Localization and Luminance Correction
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Solution Overview
Problem
Existing display apparatuses, particularly mini-LED and micro-LED-based displays, suffer from defective sub-pixels that do not light up correctly, causing adjacent normal sub-pixels to incorrectly illuminate, leading to poor picture quality and increased waste due to entire panel disposal.
Innovation Solution
An inspection apparatus and method that uses an image sensor to identify defective pixels, storing location and luminance correction information in a memory, and a processor to limit electrical signals to defective pixels, ensuring normal pixels are not incorrectly illuminated.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the entire display panel is disposed due to defective sub-pixels, then the reliability of the display apparatus is improved, but the loss of substance increases
Solution Approach 1:
The patent segments the display panel into individual sub-pixels and tracks their defect status separately. By storing location information and luminance correction information for each sub-pixel, the system can identify and correct defective sub-pixels without discarding the entire panel, thus resolving the contradiction between maintaining display reliability and reducing panel waste.
Solution Approach 2:
The patent applies local quality correction by storing and processing luminance correction information specifically for defective sub-pixels. The processor corrects luminance values only for identified defective sub-pixels while leaving normal sub-pixels unchanged, allowing the display panel to maintain high reliability through localized repairs rather than complete replacement.
2Manufacturing precision
If location information and luminance correction information are stored for each pixel, then the manufacturing precision is improved, but the device complexity increases
Solution Approach 1:
The patent performs preliminary action by storing location information and luminance correction information for defective sub-pixels during the inspection phase. This pre-stored information enables the processor to quickly identify and correct defective sub-pixels during operation without requiring complex real-time analysis, thus improving manufacturing precision while managing device complexity through advance preparation.
Solution Approach 2:
The patent creates a digital copy of the display panel's sub-pixel data, storing location and luminance information in memory. This copy allows the system to reference and correct defective sub-pixels without manipulating the physical panel repeatedly, improving detection accuracy while reducing the complexity of physical inspection and correction processes.
Data Source
AI summary
An inspection apparatus includes: a memory; an image sensor configured to obtain a luminance image of the display apparatus comprising a plurality of pixels; and a processor configured to recognize a defective pixel based on the obtained luminance image, configured to recognize location information of the recognized defective pixel, and configured to control the memory to store the recognized location information of the defective pixel.