Display Pixel Inspection via Dynamic Power Voltage
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Solution Overview
Problem
Display devices face image deterioration due to connection defects in transistors, which existing technologies fail to detect accurately, affecting image quality and reliability.
Innovation Solution
A display device and inspecting method that utilize a first power supply with alternating voltage levels to form current paths through pixels, allowing for detection of transistor defects by comparing currents during different periods, thereby identifying connection defects in transistors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional inspection methods are used, then the inspection process is simple, but connection defects in transistors cannot be detected accurately
Solution Approach 1:
The inspection method dynamically changes the voltage level of the first power supply between a first voltage level and a second voltage level during the inspection period. This dynamic voltage variation creates different current paths through the pixel circuit, enabling detection of connection defects in transistors that static voltage methods cannot detect.
Solution Approach 2:
The inspection method employs periodic voltage swings of the first power supply between two voltage levels during the inspection period. This periodic action allows the system to detect connection defects by comparing current characteristics at different voltage states, improving detection accuracy without requiring permanently complex circuitry.
2Reliability
If the first power supply voltage is maintained at a constant level, then the power supply is simple to control, but current paths through all transistors cannot be formed for comprehensive defect detection
Solution Approach 1:
The first power supply voltage is dynamically switched between a first voltage level and a second voltage level during the inspection period. This dynamic control forms different current paths through the pixel circuit at different voltage levels, enabling comprehensive detection of connection defects in all transistors while maintaining relatively simple control logic.
Data Source
AI summary
A display device includes: a plurality of pixels connected to scan lines, emission control lines, data lines, and a power line; a scan driver configured to supply a scan signal to the scan lines; and an emission driver configured to supply an emission control signal to the emission control lines, wherein a voltage of a first power supplied to the power line during an inspection period has a pulse form alternating between a first level and a second level that is lower than the first level, and the display device is configured to maintain the voltage of the first power at a third level.