Display Pixel Inspection With Monochromatic Telecentric Imaging
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Solution Overview
Problem
Existing automatic visual inspection systems for semiconductor light emitting devices in fluid environments suffer from low image definition due to chromatic aberration, high costs for aberration correction, and inflexibility in design, making precise and rapid inspection challenging.
Innovation Solution
An automatic display pixel inspection system using monochromatic light and a telecentric lens that adjusts distance based on wavelength to minimize chromatic aberration, allowing for clear image acquisition and efficient correction, and enabling flexible application across various inspection environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a general lens is used for inspection in fluid environment, then the system structure is simple, but chromatic aberration occurs causing low image definition
Solution Approach 1:
The patent changes the optical parameter by using monochromatic light instead of white light, and adjusts the lens focal length to match the wavelength of the monochromatic light. This eliminates chromatic aberration while maintaining system simplicity, achieving both clear images and structural simplicity.
2Measurement precision
If a chromatic aberration-removing lens is used, then image definition is improved, but design becomes complicated and cost increases
Solution Approach 1:
The patent extracts and eliminates the root cause of chromatic aberration by using monochromatic light instead of white light. This removes the need for complex chromatic aberration correction lenses, achieving simple design while maintaining high image definition.
Solution Approach 2:
The patent changes the light source parameter from broadband white light to monochromatic light, and adjusts the lens focal length to match the specific wavelength. This parameter change eliminates chromatic aberration without requiring additional correction optics, reducing design complexity.
3Measurement precision
If automatic control is used for chromatic aberration correction, then image definition is improved, but cost increases
Solution Approach 1:
The patent removes the need for automatic control systems by eliminating the source of chromatic aberration through monochromatic light. This achieves high image definition without requiring complex automatic control mechanisms.
Solution Approach 2:
The monochromatic light source and matched focal length configuration inherently prevent chromatic aberration without requiring external control or correction mechanisms. The system is self-sufficient in eliminating optical aberrations.
4Productivity
If existing inspection system is used, then inspection can be performed, but flexibility for design changes is poor
Solution Approach 1:
The patent creates a dynamic and flexible inspection system where the focal length can be adjusted to match different monochromatic light wavelengths. This allows the system to adapt to various design requirements while maintaining inspection capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves clear inspection images with minimized chromatic aberration at a lower cost and enhances flexibility, facilitating rapid and precise detection of assembly defects in semiconductor light emitting devices.
Implementation Method 1
a telecentric lens located outside the tank and configured to condense light reflected from the object irradiated with the red, green, or blue monochromatic light beam
Implementation Method 2
a lighting device configured to irradiate the object with a red, green, and blue monochromatic light beam in a predetermined order
Data Source
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AI summary
The present invention relates to an automatic display pixel inspection system and method and, particularly, to an automatic inspection system and method for inspecting defects occurring in the process of assembling semiconductor light emitting devices in a fluid.