Display Device Power Voltage Ripple Error Correction
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Solution Overview
Problem
Display devices face issues with power voltage ripple and capacitance decrease, leading to increased noise and error bits in write and read operations, which affect the reliability of memory devices and display performance.
Innovation Solution
A display device that generates test strobe signals by shifting the phase of the strobe signal to perform test write and read operations, and adjusts the power voltage based on error bits detected during these operations to maintain optimal voltage levels, thereby minimizing error occurrences and adapting to capacitance changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the power voltage is used as the operating voltage of the input/output buffer, then the power voltage can be simplified, but the ripple of the power voltage increases and noise increases leading to error bits
Solution Approach 1:
The patent implements dynamic adjustment of the power voltage based on detected error bits. The timing controller monitors error bits from memory operations and dynamically changes the power voltage level to eliminate errors, transforming a static voltage supply into a dynamic adaptive system that resolves the contradiction between simplicity and reliability
Solution Approach 2:
The patent establishes a feedback loop where the timing controller detects error bits from memory read/write operations and uses this information to adjust the power voltage. This feedback mechanism allows the system to automatically correct voltage-related errors without external intervention, maintaining reliability while keeping the voltage supply structure simplified
2Duration of action of stationary object
If the capacitance of the capacitor decreases over time, then the capacitor can be used longer, but the ripple characteristic of the power voltage changes and noise increases
Solution Approach 1:
The patent implements dynamic adjustment of the power voltage in response to changing capacitor characteristics over time. As capacitor capacitance decreases with age, the system dynamically modifies the power voltage level to compensate for the changed ripple characteristics, maintaining stable operation throughout the capacitor's extended lifespan
Solution Approach 2:
The patent changes the power voltage parameter in response to capacitor degradation. By adjusting the voltage level based on detected error patterns, the system compensates for the changing electrical characteristics of the aging capacitor, maintaining reliable operation despite capacitance decrease
3Reliability
If test operations are performed to detect error bits, then the power voltage can be optimized, but the operation time increases
Solution Approach 1:
The patent performs test operations selectively rather than continuously. Test operations are triggered only when error bits are detected, performing just enough testing and voltage adjustment to resolve the specific error condition, rather than exhaustive continuous testing
Solution Approach 2:
The patent implements a rapid test and adjust cycle. When error bits are detected, the system quickly performs test operations and adjusts the power voltage to eliminate errors, then returns to normal operation. This skipping approach minimizes the time lost to testing by only performing it when necessary
Data Source
AI summary
A display device is disclosed that includes a display panel, a data driver, a timing controller, a memory device, and a power voltage generator. The display panel includes pixels. The data driver is configured to apply data voltages to the pixels. The timing controller is configured to control the data driver, to generate a test strobe signal by shifting a phase of a strobe signal, to perform a test write operation and a test read operation with the memory device based on the test strobe signal, and to increase a power voltage when an error bit occurs in the test write operation and the test read operation. The memory device is configured to sample memory data received from the timing controller using the strobe signal and to store sampled memory data. The power voltage generator is configured to apply the power voltage to the memory device.