Display Defect Detection Using Resistive Voltage Drop Measurement

The patent incorporates resistors and switches into the wiring structure before operation to enable defect detection. The resistors are pre-positioned at specific locations (e.g., at the electrode or contact hole) and the switches are pre-configured to connect these resistors to measurement circuits only when needed, allowing defect detection capability to be built into the structure in advance without affecting normal operation.

The patent uses resistors as intermediary elements to detect defects. By measuring voltage drops across these resistors when switches are closed, the system can indirectly detect wiring defects, contact hole defects, or electrode defects without directly inspecting these hard-to-reach components. The resistors act as mediators that convert physical defects into measurable electrical signals.

The patent divides the wiring system into multiple segments, each with its own resistor and switch. By measuring voltage drops at different segments (first wiring, second wiring, contact hole, electrode), the system can pinpoint the exact location of a defect. This segmentation allows reliable defect localization while keeping each individual measurement point relatively simple to manufacture.

The patent employs switches that can be periodically closed to connect resistors to measurement circuits during specific detection phases. This periodic action allows the system to perform defect detection at different stages (e.g., before and after assembly) without requiring all measurement components to be permanently connected, thereby simplifying the manufacturing process while maintaining detection reliability.