Display Panel Side Routing Test Pads for Narrow Bezels
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Solution Overview
Problem
The challenge in manufacturing light emitting display panels with reduced or no non-display areas is the need for routing lines on lateral surfaces, requiring a method to check the quality of these lines effectively.
Innovation Solution
The solution involves providing test pads for measuring resistances of routing lines between pads on the lateral surfaces of the light emitting display panel, ensuring the connection quality is maintained.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the non-display area is reduced or eliminated to increase user immersion, then the display area is increased, but routing lines must be provided on lateral surfaces which complicates the manufacturing process and requires additional quality checking structures
Solution Approach 1:
The patent moves the routing lines from the traditional planar surface to the lateral surface of the substrate, utilizing a different spatial dimension. This allows the routing lines to connect substrates without occupying display area on the front surface, thereby increasing the effective display area while maintaining connection functionality through the side surfaces of the substrates.
Solution Approach 2:
The patent introduces test pads as intermediary elements that facilitate quality checking of the routing lines. These test pads are positioned on the lateral surfaces and serve as access points for measuring resistance and verifying the integrity of routing lines, enabling quality control without requiring additional display area or complex external testing equipment.
2Area of stationary object
If routing lines are provided on lateral surfaces to eliminate non-display areas, then the display area is maximized, but a structure for checking the quality of routing lines becomes necessary
Solution Approach 1:
The patent implements self-testing functionality by incorporating test pads directly onto the lateral surfaces of the substrates. These test pads enable resistance measurements of the routing lines without requiring external testing equipment or disassembly of the display structure. The system essentially tests itself through easily accessible test pads that are integrated into the lateral surface routing structure.
Solution Approach 2:
The patent replaces complex physical inspection methods with electrical resistance measurement. Instead of requiring mechanical probing or visual inspection of the routing lines, the invention uses electrical properties (resistance) to detect and measure the quality of routing line connections. This substitution simplifies the detection process and enables automated quality control.
3Reliability
If test pads are provided on lateral surfaces for measuring routing line resistances, then quality checking is enabled, but the lateral surface structure becomes more complex
Solution Approach 1:
The patent merges the test pad structure with the existing lateral surface routing structure. Rather than adding separate, independent testing components, the test pads are integrated into the same lateral surface layer as the routing lines, sharing the same structural framework and manufacturing process. This merging approach enables quality control functionality while minimizing additional structural complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for effective detection of defects in routing lines, ensuring high-quality connections and minimizing non-display areas, thereby enhancing the display's immersion and reducing manufacturing complexities.
Implementation Method 1
test pads for measuring resistances of routing lines are provided between pads provided in a lateral surface of a light emitting display panel
Data Source
AI summary
A light emitting display apparatus includes a first substrate including pixels and signal lines arranged in a first direction and a second substrate disposed on a rear surface of the first substrate, wherein a routing portion including routing lines is provided on a first lateral surface of the first substrate and a second lateral surface of the second substrate. In the first substrate, a first pad portion adjacent to the first lateral surface includes first pads connected to the signal lines and the routing lines and first test pads for determining the occurrence or not of defects of the routing lines. In the second substrate, a second pad portion adjacent to the second lateral surface includes second pads connected to the routing lines and second test pads connected to the first test pads.