Display Scan Driver Layout With Dummy Holes for Signal Accuracy
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Solution Overview
Problem
Existing display apparatuses face challenges in accurately generating scan signals, which affects the quality of images displayed, particularly due to the arrangement of transistors and electrodes in the display area and peripheral areas.
Innovation Solution
The display apparatus incorporates a substrate with a display area and peripheral area, featuring transistors with specific semiconductor layers and gate electrodes, along with insulating layers and dummy holes to improve signal accuracy and quality, including a scan driver with stages and output terminals connected to the first transistor, which includes an oxide semiconductor layer and a second transistor with a silicon semiconductor layer, ensuring precise signal generation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If transistors and electrodes are arranged in the display area and peripheral area, then the display apparatus can control brightness and transfer scan signals, but the scan signal generation accuracy deteriorates
Solution Approach 1:
The scan driver is divided into multiple stages, with each stage containing specific transistors (first transistor with oxide semiconductor, second transistor with silicon semiconductor) and electrodes arranged in a segmented manner. This segmentation allows independent optimization of each stage's signal generation accuracy while managing overall device complexity.
Solution Approach 2:
Different semiconductor materials are used in different locations: oxide semiconductor in the first transistor for low-temperature processing and silicon semiconductor in the second transistor for high mobility. Dummy holes are strategically positioned at specific locations to improve interface quality. This local quality approach optimizes scan signal generation accuracy at critical positions without requiring complete redesign of the entire structure.
2Measurement precision
If dummy holes are added to improve scan signal accuracy, then signal generation quality improves, but device structure complexity increases
Solution Approach 1:
Dummy holes are created in the insulating layer before final electrode formation. This preliminary action prepares the structure for improved signal accuracy by removing defects and improving interface quality in advance, allowing subsequent electrodes to be formed with better characteristics without adding excessive complexity to the final structure.
Solution Approach 2:
The dummy holes act as intermediary structures that mediate between the insulating layer and the electrodes. They improve the interface quality and signal transmission characteristics without requiring direct modification of the electrode design itself, thus improving scan signal accuracy while maintaining relatively simple electrode structures.
Data Source
AI summary
A display apparatus includes a substrate having a display area and a peripheral area outside the display area, a transistor in the display area and a light-emitting element electrically connected to the transistor, and a scan driver in the peripheral area, wherein the scan driver includes a first transistor disposed on the substrate and including a first semiconductor layer comprising an oxide semiconductor and a first gate electrode overlapping the first semiconductor layer, a second transistor disposed on the substrate and including a second semiconductor layer comprising a silicon semiconductor and a second gate electrode overlapping the second semiconductor layer, and insulating layers disposed on the substrate and defining dummy holes not overlapping the first semiconductor layer and the second semiconductor layer, wherein the dummy holes are spaced apart from the first semiconductor layer and the second semiconductor layer and overlap dummy semiconductor layers adjacent to the first semiconductor layer.