Display Substrate Side-Trace Resistance Detection via Pad Connection

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Solution Overview

Problem

The challenge in the display technology field is the difficulty in measuring and adjusting the resistance of side traces on display substrates, which are crucial for maintaining optimal signal transmission and display performance, especially in bezel-free designs where the limited internal space and placement of side traces make conventional resistance testing inconvenient.

Innovation Solution

A method is introduced that forms detection units by connecting first and second pads through a connection part, allowing for the measurement of resistance across the side traces, and this method can be applied to both signal and redundant pads to ensure accurate resistance detection and adjustment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If side traces are placed on the side surface of the substrate to remove the bezel, then the display area is increased and bezel-free design is achieved, but the resistance testing of side traces becomes difficult and inconvenient

Engineering Contradiction:
Improvedisplay areaVSAvoidresistance testing
Core Design Contradiction:
Area of stationary objectVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces detection pads and connection parts as intermediary elements to enable resistance measurement. The detection pads are formed on the substrate surface and connected to the side traces through connection parts, creating an accessible testing interface that mediates between the side trace and measurement equipment, thus solving the measurement difficulty while preserving the bezel-free design

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent transitions the measurement approach from direct side surface measurement to top surface measurement by forming detection pads on the substrate surface. This dimensional change allows resistance testing to be performed from the accessible top surface rather than attempting to measure the side trace directly on the substrate edge

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Difficulty of detecting and measuring

If detection units are formed by connecting first pads through connection parts, then resistance measurement becomes possible, but the device structure becomes more complex

Engineering Contradiction:
Improveresistance measurementVSAvoiddevice structure
Core Design Contradiction:
Difficulty of detecting and measuringVSDevice complexity

Solution Approach 1:

The patent segments the measurement function into distinct components: detection pads for signal application, connection parts for electrical connection, and test terminals for measurement access. This segmentation allows each component to perform its specific function efficiently while maintaining overall system manageability and clarity

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS12198989B2Method for detecting resistance of side trace of display substrate and display substrate
Publication Date: 2025.01.14 BOE TECHNOLOGY GROUP CO LTD
  • US12198989B2 patent drawing
  • US12198989B2 patent drawing
  • US12198989B2 patent drawing

AI summary

The present disclosure provides a method for detecting resistance of a side trace of a display substrate and the display substrate, and belongs to the field of display technology. In the method for detecting resistance of a side trace of a display substrate, the display substrate includes: a base substrate including a first surface and a second surface opposite to each other; a plurality of first pads at intervals on the first surface; and a plurality of second pads at intervals on the second surface; the first pad is electrically connected to a corresponding second pad through a side trace; the method includes forming at least one detection unit; wherein forming the detection unit includes: connecting two first pads through a connection part; and detecting two second pads in the detection unit, and obtaining resistance of the detection unit to obtain the resistance of the side trace.