Display Substrate Motherboard Detecting Region Design
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Solution Overview
Problem
In the manufacturing of display substrates, existing methods face challenges in accurately measuring film thickness and segment differences due to recognition discrepancies among measurers and the need for physical scratching, which affects data accuracy and efficiency.
Innovation Solution
A display substrate motherboard design that includes a base substrate with display substrate regions and detecting regions, where the film layers in the detecting regions are in the same layer as those in the display substrate regions, allowing for accurate measurement using a segment difference probe without scratching the films, and featuring dummy pixel regions and peripheral frames for precise detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If physical scratching is used to measure film thickness, then measurement can be performed, but measurement precision deteriorates due to recognition discrepancies among measurers and data output discrepancy
Solution Approach 1:
The invention divides the measurement system into two independent parts: (1) a detecting region with artificial patterns that provides standardized reference measurements, and (2) the display substrate region to be measured. By segmenting the measurement process into reference-based detection and actual substrate measurement, the patent eliminates recognition discrepancies among measurers while maintaining accurate segment difference measurements.
Solution Approach 2:
The patent creates artificial patterns in the detecting region that copy the essential measurement targets (pixel contours, film structures) but with standardized, unambiguous geometries. These copied patterns serve as reference standards that eliminate the variability inherent in natural pixel contour recognition, providing consistent measurement baselines without affecting the actual display substrate.
2Productivity
If manual measurement methods are used, then flexibility is maintained, but productivity deteriorates due to high manpower and time consumption
Solution Approach 1:
The patent incorporates detecting regions with artificial patterns into the display substrate motherboard during the manufacturing process, before actual measurement occurs. This preliminary integration of measurement references eliminates the need for post-manufacturing setup and calibration, enabling automated, high-speed measurement without requiring complex external measurement systems.
Solution Approach 2:
The detecting region with artificial patterns serves multiple functions: (1) providing reference standards for film thickness measurement, (2) enabling automated contour recognition, (3) facilitating segment difference detection, and (4) serving as a calibration reference for measurement equipment. This multi-functionality consolidates multiple measurement capabilities into a single integrated structure, improving productivity without proportionally increasing device complexity.
3Measurement precision
If detecting regions are added to the display substrate motherboard, then measurement precision improves, but device complexity increases due to additional structures
Solution Approach 1:
The patent applies local quality by creating detecting regions with specific artificial patterns only in predetermined locations on the display substrate motherboard, while the rest of the substrate maintains its normal display structure. This localized approach concentrates measurement functionality in specific areas without requiring complex modifications across the entire substrate, minimizing overall structural complexity while achieving high measurement precision.
Data Source
AI summary
A display substrate motherboard and a manufacturing method and a detecting method thereof are provided. The display substrate motherboard includes a base substrate, a plurality of display substrate regions located on the base substrate to form a plurality of display substrates, and a plurality of spacer regions located among the display substrate regions, at least one detecting region being disposed in the spacer regions. The detecting region includes at least one film layer. The display substrate region includes at least one film layer which is disposed in a same layer as the at least one film layer of the detecting region, the film layer of the detecting region having a same thickness as the film layers in the display substrate regions.