Display Substrate Inspection Using Oblique Pixel-Group Comparison
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Solution Overview
Problem
Existing methods struggle to effectively inspect display substrates for defects in pixel patterns that are not periodic with respect to the vertical and horizontal directions in which pixels are arranged.
Innovation Solution
A method of inspecting display substrates involves capturing images of pixel patterns, grouping pixels, and comparing them with adjacent pixel groups in an oblique direction to detect defects, using an optical inspection device that includes a stage, lighting unit, imaging unit, and defect determination unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If pixel patterns are compared only in vertical and horizontal directions, then the inspection method is simple, but defects in non-periodic pixel patterns cannot be detected
Solution Approach 1:
The patent introduces an oblique direction (third direction) for comparing pixel patterns, in addition to the conventional vertical and horizontal directions. This dimensional expansion enables the detection of defects in non-periodic pixel patterns that cannot be detected by traditional two-directional comparison methods, thereby resolving the contradiction between detection accuracy and method complexity.
2Reliability
If pixel groups are compared in multiple directions, then defect detection accuracy improves, but inspection time increases
Solution Approach 1:
The patent divides the display substrate into multiple pixel groups and performs comparative inspection on each group. By segmenting the inspection process into discrete pixel group comparisons, the method achieves comprehensive defect detection while maintaining efficient processing through systematic organization of inspection tasks.
Solution Approach 2:
The patent performs preliminary grouping of pixels into pixel groups before conducting defect detection. This preliminary organization allows for more efficient comparison operations, as the grouping structure enables systematic checking of pixel patterns without requiring exhaustive individual pixel analysis, thus reducing overall inspection time while maintaining high detection accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of defects in pixel patterns by applying a comparison method based on an oblique direction, ensuring thorough inspection of the entire display area.
Implementation Method 1
obtaining a captured image of the pixel patterns of the display substrate
Data Source
AI summary
A method of inspecting a display substrate including pixel patterns provided in pixel areas disposed in a display area in a first direction and a second direction may include obtaining a captured image of the pixel patterns of the display substrate, grouping pixels included in the captured image by grouping at least two pixels disposed in the first direction into a pixel group, designating each pixel group included in the captured image as a target pixel group, comparing pixel patterns of the target pixel group with pixel patterns of an adjacent pixel group positioned in a third direction with respect to the target pixel group, and determining whether the pixel patterns of the target pixel group are defective.