Display Substrate Test Line Segmentation for Contact Damage Prevention

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Solution Overview

Problem

The existing testing processes for display apparatuses often damage the test lines when a contact is applied, leading to inaccurate defect testing and potential damage to the display substrate.

Innovation Solution

A display substrate design featuring a main-test-line and a sub-test-line in different layers, where the sub-test-line is exposed and used for testing, allowing for accurate defect detection without damaging the main-test-line.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a contact is applied to the test line for testing, then the testing function is achieved, but the test line is damaged

Engineering Contradiction:

Improvetesting accuracyVSAvoidtest line integrity

Core Design Contradiction:

ReliabilityVSStrength

Solution Approach 1:

The test line is divided into two separate lines: a main test line and a sub test line. The sub test line is used for contact-based testing while the main test line remains intact for future testing needs. This segmentation allows the testing function to be achieved without damaging the primary test line.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The sub test line serves as a copy or duplicate of the main test line's functionality. Instead of directly contacting the main test line, a duplicate path is created that can be contacted for testing purposes, thereby preserving the original test line.

Inventive Principle:

Principle #26Copying

2Productivity

If the main test line is used for testing, then testing is performed, but the test line cannot be reused for future testing

Engineering Contradiction:

Improvetesting efficiencyVSAvoidtest line service life

Core Design Contradiction:

ProductivityVSDuration of action of stationary object

Solution Approach 1:

By dividing the test line functionality into main and sub test lines, the system enables repeated use of the main test line while the sub test line absorbs the wear from contact-based testing operations.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The sub test line acts as a disposable or sacrificial element that can be damaged during testing without affecting the main test line's long-term usability. This allows efficient testing operations while preserving the primary test path.

Inventive Principle:

Principle #27Cheap short-living objects (Disposable)

3Device complexity

If a single test line is used, then the structure is simple, but contact-based testing damages the only test line

Engineering Contradiction:

Improvetest line structureVSAvoidtesting accuracy

Core Design Contradiction:

Device complexityVSReliability

Solution Approach 1:

The test line structure is segmented into main and sub components, adding minimal complexity while enabling reliable contact-based testing without compromising the primary test line's integrity.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The sub test line serves as an intermediary element between the testing contact and the main test line. It mediates the contact interaction, protecting the main test line from direct contact damage while still enabling testing functionality.

Inventive Principle:

Principle #24Intermediary (Mediator)

Data Source

PatentUS9214401B2Display substrate, method of manufacturing the same and display apparatus having the same

Publication Date: 2015.12.15 SAMSUNG DISPLAY CO LTD

AI summary

A display substrate includes a base substrate including a display area and a peripheral area surrounding the display area, a switching element in the display area, a main-test-line in the peripheral area, extending in the second direction and electrically connected with a data line, a sub-test-line in the peripheral area, and a test pad in the peripheral area and electrically connected with the main-test-line and the sub-test-line. The switching element is electrically connected with a gate line extending in a first direction and the data line extending in a second direction crossing the first direction. The sub-test-line is electrically connected with the data line. The sub-test-line is in a different layer from the main-test-line.