Display Substrate Test Transistor for Accurate Array Testing
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Solution Overview
Problem
The complexity of modern display devices requires more accurate array tests for transistors, especially in high-resolution displays, where existing technologies struggle to effectively perform these tests due to the intricate circuit structures.
Innovation Solution
A display substrate and mother substrate design that includes a pixel circuit with a switching transistor, a pixel transistor, and a test transistor, where the test transistor is connected to a data line and receives a test voltage, allowing for an array test to be performed while the pixel transistor is disconnected from the data line by a compensation capacitor, utilizing a bridge pattern for electrical connection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the pixel transistor is disconnected from the data line by a compensation capacitor to simplify the circuit structure, then the manufacturing complexity is reduced, but the ability to perform accurate array testing is lost
Solution Approach 1:
A test transistor is introduced as an intermediary component between the pixel transistor and data line. This test transistor includes a gate terminal, source terminal, and drain terminal that can be independently controlled to enable testing of the pixel transistor even when it is disconnected from the data line by the compensation capacitor. The test transistor acts as a mediator that provides a test path without requiring direct connection between the pixel transistor and data line during normal operation.
2Measurement precision
If a test transistor is added to enable array testing of disconnected pixel transistors, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The test transistor is designed with multi-functionality to minimize additional complexity. It can operate in multiple modes: performing array testing on pixel transistors, serving as a regular transistor in the display circuit, and being controlled through existing gate, source, and drain terminals. This universal design allows the test transistor to fulfill multiple roles without requiring separate dedicated test circuitry for each function.
Data Source
AI summary
A display substrate includes: a pixel circuit including: a switching transistor connected between a first terminal of a compensation capacitor and a data line; and a pixel transistor connected between a second terminal of the compensation capacitor and a first voltage line, the pixel transistor to receive a test voltage; and a test transistor including: a test gate terminal to receive a test signal; a test source terminal electrically connected to the first voltage line; and a test drain terminal electrically connected to the data line.