Display Optical Inspection Using TEG Reflectance Measurement
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Solution Overview
Problem
Existing methods for determining the optical characteristics of display devices are cumbersome and time-consuming, particularly when assessing organic light-emitting display apparatuses with multiple pixels of different colors.
Innovation Solution
An optical characteristic determination device and method that utilizes an optical measuring instrument to measure the reflectance of a test element group (TEG) with the same configuration as the light-emitting elements, determining optical characteristics such as color coordinates and luminance without powering the elements, thereby simplifying and accelerating the process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional methods are used to determine optical characteristics of light emitting elements, then measurement accuracy is maintained, but the process becomes cumbersome and time-consuming
Solution Approach 1:
The patent creates a test element group (TEG) that copies the structural configuration of the light emitting elements being tested. By measuring the reflectance of this copy structure instead of the actual light emitting elements, the system achieves rapid optical characteristic determination without the complexity of powering and measuring the functional elements themselves.
Solution Approach 2:
The patent introduces an intermediary measurement approach by using reflectance measurement as a proxy for direct optical characteristic measurement. The optical measuring instrument measures reflectance of the TEG structure, which serves as an intermediary parameter that correlates with the optical characteristics of the light emitting elements, thereby simplifying the measurement process.
2Measurement precision
If light emitting elements are powered to measure optical characteristics, then accurate optical data is obtained, but the process becomes more complex and time-consuming
Solution Approach 1:
The patent performs preliminary structural preparation by forming the test element group (TEG) with the same configuration as the light emitting elements before measurement. This preliminary action allows the system to measure optical characteristics without needing to power the light emitting elements, thereby reducing measurement time while maintaining accuracy through the correlated reflectance measurement.
Solution Approach 2:
By creating a copy structure (TEG) that replicates the configuration of the light emitting elements, the patent enables accurate optical characteristic determination without the time-consuming process of powering the actual light emitting elements. The copy structure allows for rapid reflectance measurement that correlates with the optical properties of the functional elements.
3Loss of information
If multiple light emitting elements of different colors are measured individually, then comprehensive optical data is obtained, but the inspection process becomes cumbersome
Solution Approach 1:
The patent merges the measurement of multiple light emitting elements by incorporating multiple TEG elements with different configurations into a single integrated measurement structure. The optical measuring instrument can measure the reflectance of all TEG elements simultaneously or in rapid succession, obtaining comprehensive optical data for multiple elements without the cumbersome process of individual measurement.
Solution Approach 2:
The patent creates a universal measurement approach where the optical measuring instrument measures reflectance across multiple TEG elements with different configurations (representing different colors) using the same measurement process. This multi-functional approach allows comprehensive optical characteristic determination for all elements simultaneously, greatly improving inspection efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables quick and simple determination of optical characteristics of display devices, omitting the need to power the light-emitting elements and allowing for rapid inspection of mother substrates.
Implementation Method 1
measuring a reflectance of the TEG element based on an amount of light reflected from the TEG element
Data Source
AI summary
The present disclosure relates to an optical characteristic determination device, and particularly, to an optical characteristic determination device and an optical characteristic determination method for a display device that allow simple and fast determination of optical characteristics of the display device. According to an aspect of the present disclosure, there is provided an optical characteristic determination device for a display device, including: an optical measuring instrument irradiating a test element group (TEG) element that has the same configuration as a light emitting element of a substrate and measuring a reflectance of the TEG element based on the amount of light reflected from the TEG element; and a 10 processing unit determining optical characteristics of the TEG element based on the reflectance of the TEG element from the optical measuring instrument.