Test Circuit for Display Panel Data Line Fault Detection

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Solution Overview

Problem

In display panel manufacturing, it is challenging to determine whether the upper or lower data line is abnormal during signal writing, leading to potential misjudgments and defects in the display panel.

Innovation Solution

A test circuit is designed with N first and N second test pads, a switching circuit, and a control circuit to individually test and determine the normal functioning of the data lines by outputting data signals and detecting pixel brightness or electric field intensity, allowing for precise identification of abnormal lines.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If data signals are simultaneously written to the display panel on both sides, then the testing efficiency is improved, but it becomes impossible to determine whether the upper or lower data line is abnormal

Engineering Contradiction:
Improvetesting efficiencyVSAvoiddiagnostic information
Core Design Contradiction:
ProductivityVSLoss of information

Solution Approach 1:

The patent divides the simultaneous testing of both sides into separate, sequential testing stages. The switching circuit controls data signals to be written to only one side at a time, segmenting the testing process into distinct upper-side testing and lower-side testing phases. This segmentation allows precise identification of which data line is abnormal while maintaining efficient testing through systematic sequential operation.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If switching circuits are added to control individual data lines, then the ability to identify abnormal lines is improved, but the device complexity increases

Engineering Contradiction:
Improveline identification accuracyVSAvoidcircuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The switching circuit is designed with multi-functionality, serving both as a data signal routing component and as a testing control mechanism. The same switching circuit that normally directs data signals during display operation is also used to control the sequential writing of test signals to upper and lower data lines. This universal use of the switching circuit avoids adding separate dedicated testing components, thereby improving measurement precision without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The test circuit effectively identifies abnormal data lines, enabling targeted repairs and improving the yield rate of display panels by distinguishing between upper and lower data line issues during the testing process.

Implementation Method 1

a pixel detection circuit defined on the display panel, and the pixel detection circuit is configured to detect an electric field intensity of the pixels on the display panel or a brightness of the pixels on the display panel

Methodology Applied
Scientific EffectElectric field intensity detection: Electric Field

Data Source

PatentUS11145231B2Test circuit and display device
Publication Date: 2021.10.12 HKC CORP LTD
  • US11145231B2 patent drawing
  • US11145231B2 patent drawing
  • US11145231B2 patent drawing

AI summary

A test circuit and a display device are provided. The test circuit includes N first test pads, N second test pads, a first test circuit, a switching circuit, and a control circuit. The first test circuit is configured to output a plurality of test signals to the test pads. The control circuit outputs a control signal to the switching circuit to control the N first switching circuits to be individually turned on simultaneously, or control the N second switching circuits to be individually turned on simultaneously, thereby a one-side test of the display panel is achieved. Working states of the N first data lines or the N second data lines are determined according to a brightness of the display panel.