Display Test Circuit Under IC for Narrow Bezel
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Solution Overview
Problem
Conventional auto-probe testing methods for display panels are limited by the need for wide bezels and cannot effectively test output terminals and data links in active areas, especially in wearable devices with curved or narrow designs, leading to increased defect rates and inability to check for disconnected links.
Innovation Solution
A display device with a multiplexer connected to data lines and a test circuit that includes switching elements and test pads, allowing for a lighting test without occupying additional space, enabling testing regardless of panel shape and reducing bezel width by embedding the test circuit under the integrated circuit or flexible circuit board.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If auto-probe test pads and wires are connected to the lower glass substrate in the bezel area, then testing can be performed, but the bezel width increases
Solution Approach 1:
The test circuit is merged with the drive circuit by integrating the test circuit under the integrated circuit or flexible circuit board, allowing testing functionality to be combined with existing drive circuitry rather than requiring separate bezel area components
Solution Approach 2:
The test circuit is relocated from the horizontal bezel area to the vertical dimension underneath the integrated circuit or flexible circuit board, utilizing the space beneath existing components to eliminate the need for additional bezel width
2Length of stationary object
If the test circuit is embedded under the integrated circuit or flexible circuit board, then the bezel width is reduced, but the test circuit occupies additional space within the existing structure
Solution Approach 1:
The space under the integrated circuit or flexible circuit board, which would otherwise be unused, is recovered and utilized to house the test circuit, transforming wasted space into functional testing capability
Solution Approach 2:
The integrated circuit or flexible circuit board serves dual functions: driving the display and housing the test circuit, allowing a single component structure to perform multiple functions without requiring additional dedicated space
3Adaptability or versatility
If conventional auto-probe testing methods are used, then testing can be performed on standard displays, but wearable devices with curved or narrow designs cannot be effectively tested
Solution Approach 1:
The test circuit is designed with universal applicability to work with standard displays, curved displays, and narrow wearable devices through flexible circuit board configurations that can adapt to various form factors while maintaining testing capability
Solution Approach 2:
The flexible circuit board allows the test circuit to dynamically adapt its configuration to match different display geometries, enabling the same test circuit design to function across diverse device shapes and sizes
Data Source
AI summary
A display device includes a display panel with signal wire pads connected to data lines; an integrated circuit (IC) that feeds a data voltage to the data lines; a multiplexer disposed on a substrate of the display panel, between the data lines and the integrated circuit; a flexible circuit board bonded onto the substrate of the display panel and connected to the signal wire pads; and a test circuit on the substrate of the display panel.