Display Device Test Line Intersection and Short-Circuit Prevention
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Solution Overview
Problem
Existing display devices face challenges in preventing short-circuits between resistance test lines and crack test lines, which can lead to improper crack inspection and resistance measurement due to disconnections caused by external stress or physical contact.
Innovation Solution
The display device incorporates a design where resistance test lines and crack test lines intersect in a plan view but do not overlap in the thickness direction, with the resistance checker positioned further inside than the crack test lines, reducing the area of potential disconnection and ensuring accurate crack inspection and resistance measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If resistance test lines and crack test lines are disposed to intersect in plan view, then the area occupied by test lines is reduced, but short-circuit between the lines may occur due to external stress or physical contact
Solution Approach 1:
The patent transitions from a two-dimensional planar arrangement to a three-dimensional spatial arrangement by utilizing different thickness directions (Z-axis) for the test lines. The first test line is disposed in a first thickness direction and the second test line is disposed in a second thickness direction, allowing them to intersect in plan view while being separated in the thickness direction, thus eliminating short-circuit risk while minimizing area occupation.
Solution Approach 2:
The patent implements a multi-layered structure where test lines are arranged in different thickness directions, creating a nested-like configuration. The first and second test lines are embedded at different levels (thickness directions) within the display device structure, allowing compact intersection in plan view while maintaining electrical isolation through vertical separation.
2Ease of operation
If resistance checker is positioned outside the crack test lines, then crack inspection and resistance measurement can be performed, but disconnection may occur due to external stress affecting the test lines
Solution Approach 1:
The resistance checker is positioned in a different thickness direction relative to the crack test lines, utilizing the Z-axis dimension to separate the inspection functionality from the test lines. This spatial separation in the thickness direction allows the resistance checker to remain outside the crack test lines while maintaining reliable electrical connection through the multi-layered structure, protecting against disconnection from external stress.
Data Source
AI summary
A display device includes a display area and a non-display area disposed around the display area and including a pad area. The display device includes a resistance checker disposed in the non-display area, resistance test pads disposed in the pad area, resistance test lines connecting the resistance checker with the resistance test pad, and crack test lines disposed on the outer side of the resistance checker. The resistance test lines intersect the crack test lines in a plan view.