Display Module Test Pad Gating for Denser Panel Routing

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Solution Overview

Problem

The existing display technology requires a large number of test pads for binding tests, which occupy significant trace space on the display panel, affecting wiring efficiency and complexity.

Innovation Solution

A display module with a test pad unit connected through a first gating circuit to multiple test binding units, reducing the number of test pads and allowing a larger layout space for other signal traces by forming a binding impedance testing circuit.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a large number of test pads are used for binding tests, then the binding test coverage is improved, but the trace space occupied increases and wiring complexity worsens

Engineering Contradiction:
Improvebinding test coverageVSAvoidtrace space occupied
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The test pad unit is designed to be multi-functional, serving multiple test binding units through the first gating circuit. A single test pad unit can perform binding tests on multiple test binding units (first test binding unit and second test binding unit) by switching connections via the gating circuit, thereby reducing the total number of test pads needed while maintaining comprehensive test coverage

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The first gating circuit acts as an intermediary between the test pad unit and multiple test binding units. It enables dynamic routing of test signals, allowing one test pad unit to efficiently interface with multiple test binding units without requiring direct dedicated connections for each, thus reducing trace space while preserving test capability

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If a large number of test pads are used for binding tests, then the binding test coverage is improved, but the wiring complexity increases

Engineering Contradiction:
Improvebinding test coverageVSAvoidwiring complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The test pad unit is designed to be multi-functional, serving multiple test binding units through the first gating circuit. A single test pad unit can perform binding tests on multiple test binding units (first test binding unit and second test binding unit) by switching connections via the gating circuit, thereby reducing the total number of test pads needed while maintaining comprehensive test coverage

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The first gating circuit acts as an intermediary between the test pad unit and multiple test binding units. It enables dynamic routing of test signals, allowing one test pad unit to efficiently interface with multiple test binding units without requiring direct dedicated connections for each, thus reducing trace space while preserving test capability

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20260024475A1Display module and display apparatus
Publication Date: 2026.01.22 WUHAN TIANMA MICRO ELECTRONICS CO LTD
  • US20260024475A1 patent drawing
  • US20260024475A1 patent drawing
  • US20260024475A1 patent drawing

AI summary

The present application discloses a display module and a display apparatus. The display module includes a display panel, a driver chip, a test pad unit, and a first gating circuit. The display panel includes a display area and a non-display area surrounding at least part of the display area. The driver chip includes a plurality of chip pins, the plurality of chip pins includes test pins. The driver chip is bonded to the display panel to form at least two test binding units, each of the test binding units includes at least two sets of correspondingly bonded test pins and first binding pads, and the first binding pads are disposed in the non-display area of the display panel. The test pad unit is electrically connected to each of the test binding units respectively through the first gating circuit.