Display Mother Board Test Pad Layout for Higher Panel Yield
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Solution Overview
Problem
The current arrangement of test pads on display motherboards results in a low typesetting rate and material waste due to the occupied space, especially in wearable display products where multiple panels are formed on a large mother board and cut into smaller panels, leading to inefficient material utilization.
Innovation Solution
The display mother board is designed with test pads located on the side of the panel edge adjacent to the display region, rather than below it, allowing for a reduction in the space required for test pads and connection wires, thereby increasing the number of panels that can be arranged without affecting the typesetting rate.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test pads are arranged below the display panel, then voltage tests can be performed, but the typesetting rate decreases and material utilization rate decreases
Solution Approach 1:
The test pads are relocated from a position below the display panel to a position on the side of the panel edge, changing the spatial arrangement from a vertical stacking configuration to a lateral configuration. This dimensional repositioning allows the test pads to be arranged in a direction different from the panel edge extension direction, thereby reducing the space occupied in the vertical direction and increasing the typesetting rate without compromising test functionality
2Reliability
If test pads are arranged below the display panel, then voltage tests can be performed, but material utilization rate decreases
Solution Approach 1:
By repositioning the test pads to the side of the panel edge and arranging them in a direction different from the panel edge extension direction, the design optimizes the use of available space on the display mother board. This reduces the wasted space that would otherwise be required to accommodate test pads and connection wires below each panel, thereby improving material utilization rate and reducing material waste
3Productivity
If test pads are arranged on the side of the panel edge, then typesetting rate improves, but space for connection wires may be limited
Solution Approach 1:
The test pads within each pad group are arranged in a specific direction different from the panel edge extension direction, creating an optimized local configuration. This local arrangement minimizes the space required for both test pads and connection wires, allowing the connection wires to be routed efficiently within the available space without compromising the improved typesetting rate
Data Source
AI summary
Provided is a display mother board including a plurality of sub-regions. At least two sub-regions are arranged in a first direction. The sub-region includes a display panel including a display region, a wiring region and a step region arranged in the first direction, and test pads. The display panel includes a first panel edge, which is an edge of the step region and extends in a second direction intersecting the first direction. The test pads are located on a side of the first panel edge adjacent to the display region. The sub-region includes at least one first pad group each including a plurality of test pads arranged in a direction different from the second direction. Also provided are a display panel formed by cutting the display mother board and a display apparatus including the display panel.