Display Test Switch Layout for Seamless Tiled Panels
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Solution Overview
Problem
Traditional light emitting devices often have test elements disposed in the peripheral area, which reduces the screen-to-body ratio and affects the display effect, and also complicates the tiling process by creating a sense of seam in tiled displays.
Innovation Solution
The electronic device incorporates test switch elements within the display area of the substrate, allowing for reduced peripheral space and enabling effective testing of light emitting units while maintaining a high screen-to-body ratio and improving tiling aesthetics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test elements are disposed in the peripheral area of the light emitting device, then the testing function is provided, but the screen-to-body ratio decreases and the display effect is affected
Solution Approach 1:
The test switch element is moved from the traditional peripheral area (2D plane arrangement) into the active display area by utilizing the vertical dimension and overlapping structures. The test switch element is disposed over the substrate and overlaps with underlying circuit structures, allowing it to occupy space in the vertical dimension rather than consuming horizontal display area, thus maintaining a high screen-to-body ratio while providing testing functionality.
2Reliability
If test elements are disposed in the peripheral area, then testing is enabled, but the tiling process becomes complicated with visible seams
Solution Approach 1:
The test switch element is extracted from the peripheral area and repositioned within the active display area. This extraction eliminates the need for peripheral test regions in tiled displays, allowing multiple display modules to be tiled together without visible seams or complex alignment requirements for test elements, thereby simplifying the tiling process.
3Area of stationary object
If test switch elements are disposed within the display area, then the screen-to-body ratio is increased, but the integration with data lines and scan lines becomes more complex
Solution Approach 1:
The test switch element is merged with the existing pixel circuit structures by sharing common elements such as data lines and scan lines. The test switch element is electrically connected to the data line and scan line that are already present in the pixel circuit, allowing it to share the same signal transmission paths and reducing the need for separate dedicated test signal lines, thereby simplifying the overall circuit integration.
Solution Approach 2:
The data lines and scan lines are designed to serve dual functions: driving the light emitting units during normal operation and controlling the test switch element during testing. This multi-functionality reduces the number of separate signal lines needed and simplifies the circuit architecture while enabling both display and testing functions within the same circuit framework.
Data Source
AI summary
An electronic device includes a substrate including a first surface and a second surface opposite to the first surface; a first data line and a second data line disposed on the first surface of the substrate and extending along a first direction; a first electronic unit disposed on the first surface of the substrate; a first control unit disposed on the first surface of the substrate; a first scan line crossing the first data line and the second data line, wherein the first control unit is electrically connected between the first electronic unit and the first scan line; a first switch element disposed on the first surface of the substrate, and comprising a first gate; a first conductive pad disposed on the second surface of the substrate; and a first signal line electrically connected between the first gate of the first switch element and the first conductive pad.