Display Device Test Terminals for Contact Failure Reduction
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Solution Overview
Problem
The manufacturing process of liquid crystal panels faces challenges with high contact failure rates due to the small terminal pitch of signal input terminals, requiring expensive test probes and precise alignment, which can lead to undetected defects and increased costs.
Innovation Solution
A display device with test counter electrode and test storage capacitor line terminals of sufficient size, allowing for equal potential difference between pixel electrodes and counter electrodes, eliminating the need for expensive test probes and precise alignment mechanisms, and enabling solid-pattern displays without the need for additional transistors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If signal input terminals are arranged at a small pitch to accommodate many scanning lines and data lines, then the number of terminals increases, but contact failure rate increases and testing cost increases
Solution Approach 1:
The patent extracts the test function from the signal input terminals by providing separate test counter electrode terminals and test storage capacitor line terminals. This allows testing to be performed independently without using the closely-spaced signal input terminals, thereby eliminating contact failure risks while maintaining the ability to test all required functions.
Solution Approach 2:
The patent introduces intermediary test terminals that serve as mediators between the testing equipment and the display device. These test counter electrode terminals and test storage capacitor line terminals act as intermediaries that receive test signals and transmit them to the appropriate electrodes, avoiding direct contact with the small-pitch signal input terminals.
2Ease of operation
If a test probe is used to input signals to signal input terminals for solid-pattern display, then display testing can be performed, but expensive high-precision probe alignment equipment is required
Solution Approach 1:
The patent extracts the testing function from the signal input terminal pathway and creates a separate testing pathway using dedicated test terminals. This eliminates the need for complex probe alignment mechanisms required when accessing closely-spaced signal input terminals, as the test terminals can be accessed with simpler, less precise positioning.
3Adaptability or versatility
If additional transistors are provided for test terminal control, then further display tests can be performed, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent merges the test terminal control function with existing transistor structures in the display device. The test counter electrode terminals and test storage capacitor line terminals utilize the existing pixel electrode and counter electrode structures, eliminating the need for additional dedicated test transistors while still enabling comprehensive display testing.
Data Source
AI summary
A display device includes: a plurality of pixel electrodes; a counter electrode provided so as to oppose the plurality of pixel electrodes to form a display capacitor between each of the plurality of pixel electrodes and the counter electrode; a plurality of storage capacitor electrodes provided so as to respectively oppose the plurality of pixel electrodes to form storage capacitors therebetween; a storage capacitor line electrically connecting together the plurality of storage capacitor electrodes; a test storage capacitor line terminal electrically connected to the storage capacitor line; and a test counter electrode terminal electrically connected to the counter electrode.


