Display Device Testing Circuit for Laser Repair Energy Monitoring
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Solution Overview
Problem
The existing laser repairing process for display devices is inefficient due to instability in laser energy, leading to failed repairs and undetected defects, resulting in wasted resources and materials as unrepaired substrates progress through the production line.
Innovation Solution
A display device with a testing circuit comprising detection pads and metal wires that allow for real-time monitoring of laser energy by measuring resistance values between specific pads, enabling immediate adjustments to ensure appropriate energy levels for successful repairs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If laser energy is increased to ensure complete cutting of residual metal film, then repair reliability improves, but risk of damaging underlying insulating layer increases
Solution Approach 1:
The patent applies preliminary action by performing a test repair on a test line before actual repair. The test line is designed with the same structure as the actual metal film and insulating layer, allowing the laser energy parameters to be optimized and verified in advance. This preliminary test ensures that the laser energy is sufficient to cut the metal film completely while remaining below the threshold that would damage the insulating layer, thus resolving the contradiction between repair reliability and preventing damage.
2Manufacturing precision
If real-time monitoring of laser energy is implemented, then repair quality improves, but production time increases
Solution Approach 1:
The patent implements preliminary action by pre-configuring the test line with specific geometric parameters (width, length, pattern) that correspond to the actual repair targets. The test line is designed beforehand to reflect the same material properties and layer structure as the production lines. This pre-established test infrastructure allows for rapid energy parameter optimization without adding significant time to the actual repair process, as the test can be performed quickly on the pre-prepared test line.
Solution Approach 2:
The patent applies copying by creating a test line that is a simplified copy of the actual metal film structure. The test line replicates the essential characteristics (material composition, layer thickness, geometric dimensions) of the production metal film but in a controlled, accessible location. This copy allows for repeated testing and optimization of laser energy parameters without affecting production time, as the test can be performed independently and the results directly applied to actual repairs.
3Speed
If test line design is optimized for quick testing, then detection speed improves, but testing circuit complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the testing function into separate, modular components: the test line (physical structure), the detection circuit (measurement system), and the control system (parameter adjustment). The test line itself is segmented into specific geometric features (straight sections, curved sections, intersection regions) that can be independently tested. This segmentation allows for simple, dedicated detection circuits that measure specific parameters (resistance, continuity) without requiring complex multi-functional testing equipment, thus achieving fast detection with minimal added complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables real-time detection of appropriate laser energy for effective repair, reducing the likelihood of substrates being incorrectly processed and minimizing waste by ensuring successful repairs during the manufacturing process.
Implementation Method 1
laser repairing process may cut off the residual metal film with appropriate energy without damaging the underlying insulating layer
Implementation Method 2
a failure in repairing a short-circuit defect of a metal film cannot be detected by a worker on site in real time, and a repair result can be determined after a resistance value of conductive glass layer is measured
Data Source
AI summary
Disclosed are a display device and a method for repairing and detecting a thin film transistor of the display device. The display device includes a plurality of thin film transistors, a gate line, a data line, and a testing circuit. The testing circuit includes a first detection pad, a second detection pad, a third detection pad, a first detection metal wire, and a second detection metal wire. The first detection metal wire is connected to the second detection pad. The second detection metal wire has a first branch, a detection metal pad, and a second branch. The first branch connects the first detection pad and the detection metal pad. The second branch connects the third detection pad and the detection metal pad. The detection metal pad overlaps with the first detection metal wire in a vertical direction. The first detection metal wire has a width same as that of the gate line, and the detection metal pad has a width same as that of the data line.