Display Panel Touch Pin Layout for Crowded Wiring Areas
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Solution Overview
Problem
Current self-capacitive touch display panels face challenges in performing touch tests due to the limited size of the wiring area, which prevents a large number of wires from being directly arranged to load test signals, resulting in lower product yield and increased costs.
Innovation Solution
The display panel design includes a display area and a terminal area with a driving chip area, featuring touch leads and test pins that allow for the transmission of test signals to touch electrodes, along with a multiplexing circuit and control pins to manage signal transmission and control states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a large number of wires are arranged in the wiring area to load test signals, then touch test capability is enabled, but the wiring area becomes too crowded and cannot accommodate all necessary wires
Solution Approach 1:
The patent moves test pin arrangements from the two-dimensional wiring area plane to the driving chip area, utilizing the vertical dimension and different spatial zone (driving chip area vs. wiring area) to resolve the space conflict. Test pins are positioned in the driving chip area where space is available, connected to touch leads that extend to touch electrodes, enabling touch testing without encroaching on the limited wiring area.
2Reliability
If test pins are arranged in the wiring area, then test signals can be transmitted, but the limited wiring area cannot accommodate the required number of test pins
Solution Approach 1:
The patent extracts the test pin arrangement from the wiring area and relocates it to the driving chip area. This separation removes the conflicting element (test pins) from the constrained space (wiring area), allowing the wiring area to maintain its original simple layout while still enabling test signal transmission through the relocated test pins in the driving chip area.
3Adaptability or versatility
If the number of wires in the wiring area is increased to support touch testing, then touch test functionality is achieved, but product yield decreases and cost increases
Solution Approach 1:
The patent makes the driving chip area serve multiple functions: it houses both the driving chip connections and the test pin arrangements for touch testing. This multi-functional use of the driving chip area eliminates the need for additional dedicated test signal paths through the wiring area, maintaining simple wiring layout and avoiding the yield reduction and cost increase associated with complex wiring arrangements.
Data Source
AI summary
The present invention provides a display panel including a display area and a terminal area adjacent to each other, the terminal area includes a driving chip area bonded with a driving chip, a plurality of touch leads are provided in the driving chip area, first ends of the plurality of touch leads are electrically connected to a plurality of touch electrodes in the display area, and a plurality of test pins is electrically connected to second ends of the plurality of touch leads and used for transmitting a test signal are also located in the driving chip area.