Display Wavefront Characterization via Impulse Response
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current display technologies face challenges in accurately measuring and correcting wavefront distortions and aberrations, which degrade the performance and quality of electronic displays, including light-field displays and head-mounted displays.
Innovation Solution
A method for characterizing and operating displays involves providing a test signal to the display, capturing its impulse response and wavefront phase using an acquisition system, and using this information to optimize display operation and correct for distortions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional display technologies are used without wavefront correction, then device complexity is reduced, but measurement precision and image quality deteriorate due to wavefront distortions and aberrations
Solution Approach 1:
The patent introduces a wavefront sensor as an intermediary device that measures wavefront distortions without requiring complex modification of the display itself. This mediator enables precise measurement of optical aberrations while keeping the overall system architecture relatively simple and modular.
Solution Approach 2:
The patent replaces complex mechanical wavefront correction systems with computational methods. By using algorithms to process wavefront sensor data and generate correction patterns, the system achieves high measurement precision without requiring complex mechanical adjustment mechanisms.
2Reliability
If wavefront correction measures are implemented, then image quality and display performance are improved, but device complexity and computational requirements increase
Solution Approach 1:
The patent implements a feedback loop where wavefront sensor measurements continuously monitor optical aberrations, and the system dynamically adjusts correction patterns accordingly. This feedback mechanism ensures stable display performance by automatically compensating for variations in wavefront distortions without requiring complex manual intervention.
Solution Approach 2:
The patent performs preliminary characterization of the optical system to pre-determine correction patterns for known aberrations. By preparing correction data in advance based on initial wavefront measurements, the system reduces real-time computational complexity while maintaining reliable performance correction.
3Manufacturing precision
If detailed wavefront characterization is performed, then manufacturing precision and quality control are improved, but measurement time and productivity are reduced
Solution Approach 1:
The patent employs periodic measurement cycles where wavefront characterization is performed at key stages of the manufacturing process rather than continuously. This periodic approach maintains high manufacturing precision by capturing critical aberration data while minimizing interruption to production flow and maintaining productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method improves the characterization and operation of displays by accurately measuring wavefront distortions and aberrations, allowing for better correction and optimization of display performance, leading to enhanced image quality and user experience.
Implementation Method 1
capturing, by at least one acquisition system placed at a distance from the display, an impulse response of the display in response to the at least one provided test signal, wherein said capturing of an impulse response comprises measuring the at the at least one acquisition system received intensity distribution of the light emitted by the display
Implementation Method 2
capturing by the least one acquisition system or by a further additional acquisition system the wave-front phase of the light emitted by the display in response to the at least one test signal
Data Source
AI summary
The disclosure relates to a method for characterizing and operating a display, such as a light-field display or a display with or without a phase screen, comprising: an input stage wherein at least one test signal is provided as input to the display, a capture stage for obtaining display output information, said capture stage comprising capturing, by at least one acquisition system placed at a distance from the display, an impulse response of the display in response to the at least one provided test signal, wherein said capturing of an impulse response comprises measuring the at the at least one acquisition system received intensity distribution of the light emitted by the display in response to the at least one test signal, and/or capturing the wavefront phase of the light emitted by the display in response to the at least one test signal.