Distributed Device Testing Circuit for On-Site Fault Isolation

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Solution Overview

Problem

In distributed device systems, installation technicians often lack the necessary tools for effective problem isolation, leading to delays as they may need to return devices to the manufacturer for testing, especially when a faulty device is not readily replaceable, causing installation delays of days or weeks.

Innovation Solution

A self-test system and method that generates a test signal at a central unit, loops it back internally, and sends it to remote units for testing, using a testing circuit with a test signal generator and checker to identify errors, allowing for sequential testing and potential on-site repair without returning non-defective devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If technicians use traditional testing methods without on-site testing tools, then device functionality can be verified after installation, but problem isolation requires returning devices to manufacturer facilities causing installation delays

Engineering Contradiction:

Improvedevice functionality verificationVSAvoidinstallation delay

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent incorporates testing circuits and test signal generators directly into the communication units before installation. This preliminary integration of testing capability allows technicians to perform diagnostics on-site without needing to return devices to manufacturer facilities, thus resolving the time loss while maintaining reliability verification

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The communication units are designed with self-testing capability through integrated testing circuits that can generate test signals and detect errors autonomously. This self-service feature enables installation technicians to isolate problems immediately without external testing equipment or manufacturer facility involvement, eliminating installation delays

Inventive Principle:

Principle #25Self-service

2Difficulty of detecting and measuring

If technicians return defective devices to manufacturer facilities for testing, then accurate problem isolation can be achieved, but installation is delayed by days or weeks

Engineering Contradiction:

Improveproblem isolation accuracyVSAvoidinstallation delay

Core Design Contradiction:

Difficulty of detecting and measuringVSLoss of time

Solution Approach 1:

The patent divides the testing function into separate, dedicated testing circuits within each communication unit. This segmentation allows the testing capability to be isolated and activated independently, enabling accurate problem isolation on-site without affecting the overall installation timeline

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The integrated testing circuits act as intermediaries between the communication unit components and the installation technician. These testing circuits generate test signals, route them through communication paths, and detect errors, providing accurate problem isolation information to technicians without requiring manufacturer facility involvement

Inventive Principle:

Principle #24Intermediary (Mediator)

3Device complexity

If multiple devices are uninstalled for testing at manufacturer facilities, then system-wide problems can be identified, but replacement devices cannot be installed immediately

Engineering Contradiction:

Improvesystem-wide problem identificationVSAvoidinstallation speed

Core Design Contradiction:

Device complexityVSProductivity

Solution Approach 1:

Testing circuits are integrated into communication units before installation, allowing system-wide testing to be performed on-site as part of the installation process. This preliminary arrangement eliminates the need to uninstall multiple devices for testing, enabling immediate installation of replacement devices when problems are identified

Inventive Principle:

Principle #10Preliminary action

4Ease of operation

If comprehensive testing capability is added to communication units, then on-site problem isolation is enabled, but device complexity increases

Engineering Contradiction:

Improveon-site problem isolationVSAvoiddevice structure

Core Design Contradiction:

Ease of operationVSDevice complexity

Solution Approach 1:

The testing circuits are merged with the existing communication unit structure, sharing common components such as signal paths, power supply, and housing. This merging approach enables on-site problem isolation capability while minimizing the increase in overall device complexity by utilizing existing structural elements

Inventive Principle:

Principle #5Merging (Combining)

Data Source

PatentUS12177106B2Systems and methods for testing operations for distributed device systems

Publication Date: 2024.12.24 ANI ACQUISITION SUB LLC

AI summary

Systems and methods for testing operations for distributed device systems may use a test signal that is generated at a central unit and looped back internally within the central unit to test the central unit. The test signal may then be sent over a communication medium to a remote unit and looped back to the central unit to test the communication path. Further, the remote unit may include a testing circuit to test internally. By sequentially testing devices within the distributed device system, problems may be isolated and potentially repaired without having to return a device to a manufacturer facility. Even when such returns are needed, only the problematic device is returned, potentially saving time in the installation.