Distributed Event-Based Test Execution for Scalable DUT Testing

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Solution Overview

Problem

Coordinating the behavior of multiple measurement systems during manufacturing testing is challenging, leading to difficulties in scaling and ensuring reliable performance of products, as existing centralized sequencer models suffer from bottlenecks and single points of failure.

Innovation Solution

The implementation of a distributed event-based testing execution system, where test pods comprising test microservices and event microservices are allocated across multiple servers, allowing for parallel execution of test plans without a centralized sequencer, enabling scalable and fault-tolerant testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a centralized sequencer model is used to coordinate measurement systems, then the system structure is simple and easy to manage, but the system suffers from bottlenecks and single points of failure that limit scalability and reliability

Engineering Contradiction:
Improvesystem reliabilityVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The centralized sequencer is segmented into distributed event microservices that operate independently across multiple servers. Each event microservice handles specific coordination tasks for particular measurement systems, eliminating the single point of failure while maintaining coordinated behavior through event-driven communication.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

An event-driven messaging system serves as an intermediary between distributed test microservices and event microservices. This mediator enables indirect coordination through events and messages, allowing systems to communicate and synchronize without direct point-to-point connections, thus reducing overall system complexity while improving reliability.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If multiple measurement systems execute tests in parallel to reduce testing time, then productivity increases, but coordinating the behavior of these systems becomes more difficult

Engineering Contradiction:
Improvetesting throughputVSAvoidcoordination complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The mechanical coordination system (centralized sequencer directly controlling each measurement system) is replaced with an event-driven communication system. Test microservices publish events to a message queue, and event microservices subscribe and respond to these events, enabling parallel execution with decentralized coordination that scales more efficiently.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system implements feedback loops where event microservices monitor the state of measurement systems and publish status events back to the system. This feedback mechanism enables automatic coordination and synchronization of parallel test execution without requiring complex centralized control logic.

Inventive Principle:
Principle #23Feedback

3Ease of operation

If a centralized sequencer is used to manage test execution, then coordination is straightforward, but the system has single points of failure that reduce reliability

Engineering Contradiction:
Improvecoordination easeVSAvoidsystem availability
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

Event microservices are designed to be universal and multi-functional, capable of handling multiple types of events and coordinating multiple measurement systems. This universality maintains operational simplicity while distributing functionality across multiple components, eliminating single points of failure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11803456B2Distributed event-based test execution
Publication Date: 2023.10.31 NATIONAL INSTRUMENTS CORP
  • US11803456B2 patent drawing
  • US11803456B2 patent drawing
  • US11803456B2 patent drawing

AI summary

Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.