Distributed IIoT Control for Production Defect Parameter Adjustment
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
As production lines expand, existing intelligent manufacturing technologies face challenges in directly detecting defects on each device, making it difficult to determine which device is causing issues and adjust parameters accordingly, leading to increased data complexity and detection costs.
Innovation Solution
A distributed control system comprising a user platform, service platform, management platform, and sensor network platform that receives defect data from various devices, summarizes it, and adjusts production parameters without requiring defect detection on each device, using models like neural networks for defect analysis and revision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If defect detection is performed on each device in the production line, then manufacturing precision is improved, but device complexity and data processing pressure increase significantly
Solution Approach 1:
The patent merges multiple defect detection devices into a unified detection system that processes defects from multiple devices simultaneously. The management platform consolidates defect data from various production devices, enabling centralized analysis and parameter adjustment without requiring separate detection systems for each device, thus reducing overall system complexity while maintaining comprehensive defect coverage
Solution Approach 2:
The management platform is designed with multi-functional capabilities to handle diverse defect data from different production devices through a single interface. It can receive, process, and analyze defect data from multiple sources uniformly, and implement parameter adjustments across different devices, eliminating the need for device-specific detection and control mechanisms
2Manufacturing precision
If defect detection is performed on each device, then manufacturing precision is improved, but data processing pressure increases
Solution Approach 1:
The patent combines defect data from multiple production devices into a unified data stream processed by the management platform. Instead of processing data separately at each device level, the system merges all defect information centrally, reducing redundant data processing operations and lowering the overall data processing load while maintaining comprehensive defect analysis capabilities
Solution Approach 2:
The management platform acts as an intermediary between defect detection devices and parameter control systems. It receives defect data from multiple devices, processes and analyzes the information centrally, then transmits parameter adjustment instructions back to the relevant devices, thereby reducing the data processing burden on individual devices and the network infrastructure
3Manufacturing precision
If comprehensive defect detection is implemented, then manufacturing precision is improved, but production time is increased
Solution Approach 1:
The defect detection system operates continuously alongside production without interrupting the manufacturing flow. Detection occurs in real-time during the production process, and parameter adjustments are implemented dynamically based on detected defects, ensuring continuous production while maintaining high detection accuracy and eliminating the need for separate inspection stages that would extend production time
Data Source
AI summary
The present disclosure discloses an intelligent manufacturing industrial Internet of Things based on distributed control, including a user platform, a service platform, a management platform, a sensor network platform, and an object platform interacting in sequence, wherein the service platform is provided with a plurality of independent service sub-platforms; the management platform is provided with a general management platform and a plurality of independent management sub-platforms, the management sub-platforms interacting with the general management platform, and the management sub-platforms interacting with the corresponding service sub-platforms; and the sensor network platform is provided with a general sensor network platform and a plurality of independent sensor network sub-platforms, the sensor network sub-platforms interacting with the general sensor network platform, and the general sensor network platform interacting with the general management platform.