Distributed Memory Testing Platform for Concurrent Multi-Condition Evaluation

Solution Overview

Problem

Conventional memory component testing is limited by the ability to apply only a single set of test conditions at a time, requiring extensive time and resources to test multiple conditions, such as different temperatures, which hampers the efficiency and thoroughness of evaluating memory components for various operating conditions.

Innovation Solution

A distributed test platform with multiple test resources and sockets, each equipped with temperature control, allows for concurrent testing of memory components across geographically dispersed locations, enabling simultaneous execution of multiple tests under various conditions using a centralized resource allocator.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional single-chamber testing is used, then testing simplicity is maintained, but testing time and resource efficiency deteriorate significantly

Engineering Contradiction:

Improvetesting efficiencyVSAvoidtesting time

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The testing system is divided into multiple independent test chambers that can operate simultaneously. Each chamber can apply different test conditions (temperature, voltage, workload) to different memory components at the same time, enabling parallel testing and significantly reducing total testing time while maintaining comprehensive coverage across multiple conditions.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The system transitions from single-condition sequential testing to multi-dimensional concurrent testing by adding spatial dimension (multiple chambers) and condition dimension (varying temperature, voltage, workload combinations). This allows testing across a broader spectrum of operating conditions simultaneously, improving productivity without compromising test thoroughness.

Inventive Principle:

Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If multiple test conditions are tested sequentially, then testing simplicity is maintained, but testing comprehensiveness deteriorates

Engineering Contradiction:

Improvetesting comprehensivenessVSAvoidtesting system complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The testing system is divided into multiple independent test chambers that can operate simultaneously. Each chamber can apply different test conditions (temperature, voltage, workload) to different memory components at the same time, enabling parallel testing and significantly reducing total testing time while maintaining comprehensive coverage across multiple conditions.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Each test chamber is designed as a universal platform that can accommodate various memory components and apply multiple test conditions through configurable parameters. This multi-functionality allows the system to adapt to different testing requirements without requiring separate dedicated systems for each condition, thereby achieving comprehensive testing while controlling overall system complexity.

Inventive Principle:

Principle #6Universality (Multi-functionality)

3Productivity

If a single test chamber is used, then device complexity is low, but testing throughput deteriorates

Engineering Contradiction:

Improvetesting throughputVSAvoidtesting system complexity

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The testing system is divided into multiple independent test chambers that can operate simultaneously. Each chamber can apply different test conditions (temperature, voltage, workload) to different memory components at the same time, enabling parallel testing and significantly reducing total testing time while maintaining comprehensive coverage across multiple conditions.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Multiple test chambers are merged into a single integrated testing system managed by a centralized controller. This combination allows simultaneous operation of multiple chambers with different test conditions, achieving high throughput while the centralized management keeps the overall system complexity manageable through coordinated control and resource allocation.

Inventive Principle:

Principle #5Merging (Combining)

Data Source

PatentUS11101015B2Multi-dimensional usage space testing of memory components

Publication Date: 2021.08.24 MICRON TECHNOLOGY INC

AI summary

A target vector representing a usage parameter corresponding to a test of a memory component is generated. A test sample is assigned to the target vector and a set of path variables are generated for the test sample. A test process of the test is executed using the test sample in accordance with the set of path variables to generate a test result. A failure associated with the test result is identified.