Distributed Self-Test Controller Circuits for In-Field Electronic System Testing
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Solution Overview
Problem
In-field testing of electronic systems, particularly automotive electronic systems, is challenging due to the difficulty in accessing and testing analog circuitry and interconnects between analog and digital sections, which account for a significant portion of in-system failures in mixed-signal ICs, and requires complex external testers or system-level test engines.
Innovation Solution
A self-test apparatus with distributed self-test controller circuits that negotiate and execute a self-test protocol across circuit devices via an inter-chip communication bus, allowing for resource sharing and self-testing at both device and board levels without a system-level test engine, using circuitry with memory to store and control self-test properties and protocols.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If external testers or system-level test engines are used for in-field testing, then testing capability is improved, but device complexity and cost increase
Solution Approach 1:
The patent implements self-test controller circuits distributed across multiple circuit devices that autonomously negotiate and execute self-test protocols without requiring external testers or system-level test engines. Each device contains its own test controller that can independently perform testing functions, eliminating the need for complex external testing infrastructure and reducing overall system complexity while maintaining reliable in-field testing capability
Solution Approach 2:
The testing function is segmented and distributed across multiple independent self-test controller circuits embedded in different circuit devices. Rather than relying on a single centralized test engine, each device has its own test controller that can autonomously perform testing, dividing the testing capability into distributed units that reduce the complexity burden on any single component
2Ease of operation
If distributed self-test controller circuits are implemented across multiple circuit devices, then ease of operation for in-field testing is improved, but device complexity increases
Solution Approach 1:
The self-test controller circuits are designed with universal functionality to negotiate and execute standardized self-test protocols across different circuit devices. This multi-functional capability allows the same test controller architecture to operate across various device types, simplifying the operation of in-field testing while the standardization reduces the perceived complexity through consistent interfaces and procedures
3Measurement precision
If self-test properties are stored in circuitry with memory, then measurement precision for test execution is improved, but loss of time for data storage and retrieval occurs
Solution Approach 1:
Self-test properties such as test vectors, expected results, and protocol parameters are pre-stored in the memory of each circuit device before field operation. This preliminary preparation allows the self-test controllers to execute tests immediately without requiring time-consuming data retrieval or setup during actual testing, thereby minimizing time loss while maintaining precise measurement capabilities through access to pre-configured test data
Data Source
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AI summary
Embodiments in accordance with the present disclosure are directed to a self-test apparatus for use in an electronic system. The self-test apparatus includes an inter-chip communication bus, a plurality of circuit devices, circuitry including memory, and test controller circuitry. The plurality of circuit devices each has a distributed self-test controller circuit and analog, mixed signal or digital circuit elements. The distributed self-test controller circuits are integrated communicatively via the inter-chip communication bus and negotiate a self-test protocol with each other. The circuitry including memory stores self-test properties of the circuit elements, the self-test properties corresponding to an identifier of each of the circuit elements and a manner or protocol in which the circuit elements are tested. The test controller circuitry collects the self-test properties of the circuit elements and controls execution of the self-test according to the negotiated self-test protocol and the self-test properties.