Distributed Test Controller and Interface Apparatus for Production Line Cost Reduction
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Solution Overview
Problem
Existing device testing methods require multiple large, multi-function testers along production lines, leading to increased costs and inadequate capabilities to meet production testing requirements.
Innovation Solution
A system comprising a processor and interface apparatus that generates and communicates test signals to devices, allowing for a custom test assembly to be mobilized and interfaced with devices, providing necessary testing capabilities without the need for extensive production line testers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple large, multi-function testers are placed at each testing station of a production line, then device testing coverage is improved, but cost increases
Solution Approach 1:
The patent divides the testing system into separate functional components: a centralized test controller that generates test signals and multiple interface apparatus that communicate these signals to devices. This segmentation allows the testing capability to be distributed across multiple stations without requiring each station to have a complete multi-function tester, thereby reducing cost while maintaining testing coverage.
Solution Approach 2:
The test controller is designed as a universal device that can generate various types of test signals for different devices. By centralizing the signal generation capability and distributing only the interface components to each testing station, the system achieves multi-functionality across the production line without duplicating expensive multi-function testers at each station.
2Adaptability or versatility
If multiple large, multi-function testers are placed at each testing station of a production line, then testing capabilities are improved, but device complexity increases
Solution Approach 1:
The testing system is segmented into a centralized intelligent controller and distributed interface apparatus. The complex signal generation and control logic are concentrated in the central controller, while each interface apparatus contains only the necessary communication connectors. This segmentation reduces the complexity at each individual testing station while maintaining overall system capabilities.
3Quantity of substance
If a custom test assembly is mobilized and interfaced to a device, then cost is reduced, but adaptability may be limited
Solution Approach 1:
The test controller is designed as a universal device capable of generating various types of test signals for different devices. By centralizing this adaptive capability and using standardized interface apparatus for communication, the system maintains adaptability across different device types while keeping individual testing stations simple and cost-effective.
Data Source
AI summary
A system for testing a device includes a processor that operates to execute instructions, where the instructions are used to test a device. The processor also operates to generate test signals associated with the test instructions. An interface apparatus is coupled to the processor and operates to communicate the test signals to the device. The interface apparatus includes connectors, where each connector operates to communicate at least one of the test signals.