Distributed X-ray Source for 3D Inspection

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Solution Overview

Problem

Current X-ray computed tomography (CT) devices face reliability and speed limitations due to the need for the X-ray source and detector to move rapidly on a circular slip ring, resulting in a complex structure and reduced inspection efficiency.

Innovation Solution

A goods inspection apparatus utilizing a distributed X-ray source that generates X-rays at multiple positions without moving the source, allowing for acquisition of 3D image information from various angles using a stationary setup, comprising multiple X-ray sources and detector arrays arranged symmetrically or in an arc structure, enabling image processing to reconstruct 3D images.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the X-ray source and detector rotate on a circular slip ring to acquire images from different angles, then 3D image information can be obtained, but the device structure becomes complex and reliability decreases

Engineering Contradiction:
Improve3D image information acquisitionVSAvoidcircular slip ring structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention divides the single rotating X-ray source system into multiple stationary X-ray sources distributed around the inspection channel. Each source emits X-rays from a different angle, eliminating the need for a single source to rotate while achieving the same multi-angle imaging capability. This segmentation resolves the contradiction by maintaining 3D imaging capability without the complex circular slip ring structure.

Inventive Principle:
Principle #1Segmentation

2Productivity

If the X-ray source moves rapidly on the slip ring to increase inspection speed, then productivity improves, but reliability and stability decrease

Engineering Contradiction:
Improveinspection speedVSAvoiddevice stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The invention transitions from a static multi-source configuration to a dynamic single-source configuration where the X-ray source rotates on a circular slip ring. This allows the system to achieve high inspection speeds by rapidly moving the source through different angular positions, capturing images from multiple angles in quick succession. The dynamic movement resolves the contradiction by enabling high productivity while maintaining reliability through controlled rotational motion rather than multiple stationary sources.

Inventive Principle:
Principle #15Dynamics

3Productivity

If multiple rows of detectors are mounted to obtain multiple section images per rotation, then inspection speed increases, but the fundamental problem of complex structure and low speed remains

Engineering Contradiction:
Improveinspection speedVSAvoiddetector array structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The invention adds the temporal dimension to the imaging process by rotating the X-ray source through different angular positions over time. Instead of using multiple detectors simultaneously to capture multiple angles, the system uses a single detector that sequentially captures images from different angles as the source rotates. This dimensional change resolves the contradiction by achieving multi-angle imaging capability without increasing detector array complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution simplifies the structure, reduces costs, and enhances inspection speed and image quality by allowing for quick and efficient data acquisition from multiple angles without the need for source movement, achieving high-definition 3D imaging.

Implementation Method 1

generates an electron beams stream by hot cathodes, scans at low energy, limits current to produce a distribution of array then performs high voltage acceleration and hits targets to generate X-ray

Methodology Applied
Scientific EffectElectron beam acceleration and X-ray generation: X-Ray

Implementation Method 2

When X-ray passes through an object, its strength varies with such information as the thickness and density of the object

Methodology Applied
Scientific EffectX-ray attenuation: Absorption (EM radiation)

Data Source

PatentEP2940456B1Article inspection device using distributed x-ray source
Publication Date: 2020.02.12 NUCTECH CO LTD
  • EP2940456B1 patent drawingFigure 1~2(B)
  • EP2940456B1 patent drawingFigure 3(A)~3(B)
  • EP2940456B1 patent drawingFigure 4~5

AI summary

This invention provides a goods inspection apparatus using distributed X-ray source, comprising: a frame; a goods passage; a goods conveyor; a distributed X-ray source for producing X-ray at different positions successively within each working cycle; a detector array for receiving the X-ray from the distributed X-ray source and outputting signals indicating the strength of the X-ray; an electronics system for receiving signals from the detectors, converting the signals into digital ones, and forming a data packet with the position numbers of corresponding detectors, outputting a sequence of data packets formed by the position numbers and signals from the plurality of detectors of the detector array; an image processing system for receiving the output from the electronics system, processing the position numbers of detectors and the corresponding signals indicating the strength of X-ray, constructing to form an image of the object under inspection; a ray source power supply for providing power to the distributed X-ray source; and a control system for exercising logical control over the respective parts to enable the respective sub-systems to work in coordination.