DLL Sampling Circuit with Voltage-Tuned Delay Control

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Solution Overview

Problem

Existing clock delay technologies, such as delay lock loops, face challenges in improving delay ability without increasing circuit area, often requiring additional delay elements which can lead to phase shifts and errors in memory systems due to temperature and voltage changes.

Innovation Solution

A sampling circuit module and memory control circuit unit that incorporate a delay lock loop with a clock control circuit, clock delay circuit, and voltage control circuit, where the driving voltage is adjusted based on a selecting signal to enhance delay ability without adding delay elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the number of delay elements in the delay lock loop is increased to improve delay ability, then the delay ability is improved, but the circuit area is increased

Engineering Contradiction:
Improvedelay abilityVSAvoidcircuit area
Core Design Contradiction:
SpeedVSArea of stationary object

Solution Approach 1:

The patent changes the operating voltage parameter of the delay lock loop circuit to improve delay ability. By adjusting the voltage supplied to the DLL circuit, the delay performance is enhanced without adding more delay elements, thus avoiding increase in circuit area. This parameter change approach directly resolves the contradiction between improving delay ability and maintaining compact circuit area.

Inventive Principle:
Principle #35Parameter changes

2Speed

If additional delay elements are added to improve delay ability, then the delay ability is improved, but phase shifts and errors occur due to temperature and voltage changes

Engineering Contradiction:
Improvedelay abilityVSAvoidphase shift stability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent adjusts the operating voltage parameter of the delay lock loop to improve delay performance. By optimizing the voltage supply to the DLL circuit, the system achieves better delay ability while maintaining phase stability and reducing sensitivity to temperature and voltage variations, thereby improving reliability without adding vulnerable delay elements.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements a feedback mechanism where the delay lock loop continuously monitors and adjusts its operation to maintain synchronization. This feedback approach compensates for phase shifts caused by temperature and voltage changes, ensuring stable performance without requiring additional delay elements that would increase circuit complexity and vulnerability.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10297297B2Sampling module including delay locked loop, sampling unit, memory control unit, and data sampling method thereof
Publication Date: 2019.05.21 PHISON ELECTRONICS
  • US10297297B2 patent drawing
  • US10297297B2 patent drawing
  • US10297297B2 patent drawing

AI summary

A sampling circuit module, a memory control circuit unit, and a data sampling method, where the sampling circuit module includes a delay lock loop (DLL) and a sampling circuit. The DLL includes a clock control circuit, a clock delay circuit and a voltage control circuit. The clock control circuit performs a delay lock for a reference clock signal, so as to output a selecting signal. The clock delay circuit delays the reference clock signal according to the selecting signal, so as to output a delay clock signal. The voltage control circuit adjusts a driving voltage outputted to the clock control circuit and the clock delay circuit according to the selecting signal. The sampling circuit samples a data signal according to the delay clock signal. Accordingly, a delay ability of the DLL may be improved by adjusting the driving voltage.