Dynamic Light Scattering Refraction Index Determination

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Solution Overview

Problem

Conventional dynamic light scattering (DLS) apparatuses require manual input of the refraction index of the solvent, which can be inaccurate and inconvenient, and are prone to measurement inaccuracies due to long-term drift, necessitating cumbersome adjustments.

Innovation Solution

Integration of a refraction index determination unit within the DLS apparatus, using movable optical elements to compensate for deviations in detection intensity and determine the refraction index simultaneously with particle size analysis, eliminating the need for external measurement and improving accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual input of refraction index is used, then operation simplicity is maintained, but measurement precision deteriorates

Engineering Contradiction:
Improverefraction index measurement precisionVSAvoidmanual input requirement
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The DLS apparatus automatically determines the refraction index by analyzing the scattered light signal without requiring manual input from the user. The system performs self-measurement using the sample itself, eliminating the need for external refraction index measurement devices and manual data entry, thereby improving both measurement precision and operational convenience.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The DLS apparatus is enhanced to perform multiple functions: it not only determines particle size but also automatically measures the refraction index of the sample. This multi-functionality integrates what were previously separate operations into a single unified system, allowing the apparatus to serve both purposes simultaneously without additional external devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If long-term operation is maintained, then productivity is improved, but measurement precision deteriorates due to drift

Engineering Contradiction:
Improvedetection signal intensity accuracyVSAvoidcontinuous operation capability
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The system continuously monitors the detection signal intensity and uses this feedback to automatically adjust operational parameters. By analyzing the scattered light signal characteristics in real-time, the apparatus can detect drift conditions and compensate for them, maintaining measurement precision during long-term continuous operation without requiring manual readjustment.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The apparatus performs preliminary characterization of the sample by determining the refraction index before conducting the main particle size measurement. This preliminary action allows the system to optimize measurement conditions specific to each sample, ensuring high precision from the start of the measurement process and maintaining stability throughout extended operation periods.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If external refraction index measurement device is used, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improverefraction index determination accuracyVSAvoidapparatus configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The refraction index measurement capability is merged into the existing DLS apparatus by utilizing the same laser source and detector system. The scattered light signal used for particle size analysis also contains information about the refraction index, allowing both measurements to be performed with a single integrated system rather than requiring separate external devices.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The DLS apparatus is enhanced to perform multiple functions: it not only determines particle size but also automatically measures the refraction index of the sample. This multi-functionality integrates what were previously separate operations into a single unified system, allowing the apparatus to serve both purposes simultaneously without additional external devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances user convenience and measurement accuracy by determining the refraction index and compensating for drift within the same apparatus, ensuring precise and reliable particle size and refraction index measurements without additional hardware or manual input.

Implementation Method 1

An electromagnetic radiation beam may then be brought in interaction with the fluidic sample, wherein the scattered electromagnetic radiation beam may then carry information indicative of physical and/or chemical properties of the fluidic sample

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 2

a movable (in particular movable by a drive unit such as a motor or a piezo element of the scattering apparatus) optical element in an optical path including at least one of the primary electromagnetic radiation and the secondary electromagnetic radiation

Methodology Applied
Scientific EffectOptical path adjustment: Refraction

Data Source

PatentUS10352841B2Determination of a refractive index of a sample and of a particle size of particles in said samples by means of a dynamic light scattering apparatus
Publication Date: 2019.07.16 ANTON PAAR GMBH
  • US10352841B2 patent drawing
  • US10352841B2 patent drawing
  • US10352841B2 patent drawing

AI summary

A dynamic light scattering apparatus includes a source configured for irradiating a sample with primary electromagnetic radiation, a detector configured for detecting secondary electromagnetic radiation generated by scattering the primary electromagnetic radiation at the sample, a refraction index determination unit including a movable optical element and configured to determine information indicative of a refraction index of the sample based on measurements of the secondary electromagnetic radiation for a plurality of different positions of the movable optical element, and a particle size determining unit configured to determine information indicative of particle size of particles in the sample by analyzing the detected secondary electromagnetic radiation and taking into account the refraction index determined by the refraction index determining unit.