DMD Maskless Lithography Biasing for Sub-Resolution Features

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Solution Overview

Problem

Existing maskless lithography techniques struggle to create smaller patterns efficiently and cost-effectively on large area substrates for high-resolution displays without hardware modifications.

Innovation Solution

A software application that biases the number of electromagnetic radiation shots or adjusts the target polygon size to form features below the native resolution of a digital micromirror device (DMD), enhancing image resolution while maintaining high image contrast.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the DMD mirror size and hardware optics are used to determine the minimum feature size, then the manufacturing process is simple and cost-effective, but the manufacturing precision is limited to a specific resolution threshold

Engineering Contradiction:
Improvefeature sizeVSAvoidhardware configuration
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent changes the parameters of the exposure process by applying line bias (adjusting polygon dimensions) and shot bias (adjusting number of shots) to modify the effective feature size below the hardware-determined minimum feature size, thereby improving manufacturing precision without changing hardware

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the mechanical/optical limitation (DMD mirror size determining minimum feature size) with a computational/software-based approach (biasing algorithms) to achieve finer feature sizes, substituting hardware constraints with software control

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Manufacturing precision

If multiple exposures and edge shifting are used to achieve smaller line-widths, then the manufacturing precision improves, but the productivity decreases due to increased process steps

Engineering Contradiction:
Improveline-width controlVSAvoidexposure throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent segments the exposure process into discrete shots that can be independently controlled and biased, allowing parallel processing and optimization of both precision and throughput by distributing shots across multiple mirrors

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses periodic scanning of the DMD mirrors across the substrate, with each mirror performing multiple shots at different positions, enabling efficient utilization of hardware resources while achieving precise line-width control through shot biasing

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the formation of smaller features than conventional hardware allows, such as extending a DMD suitable for 3.6 µm pixels to generate 2.35 µm pixels without hardware changes, improving resolution and efficiency in maskless lithography.

Implementation Method 1

Electromagnetic radiation is delivered to reflect off of a first mirror of the DMD when the centroid for the first mirror is within the one or more target polygons

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentEP3850434B1Method to enhance the resolution of maskless lithography while maintaining a high image contrast
Publication Date: 2025.07.23 APPLIED MATERIALS INC
  • EP3850434B1 patent drawingFigure 1A
  • EP3850434B1 patent drawingFigure 1B
  • EP3850434B1 patent drawingFigure 2

AI summary

The embodiments described herein relate to a software application platform, which enhances image patterns resolution on a substrate. The application platform method includes running an algorithm to provide different target polygons for forming a pattern on a target. A minimum feature size which may be formed by a DMD is determined. For each target polygons smaller than the minimum feature size determining to line bias or shot bias the one or more target polygons to achieve an acceptable exposure contrast at the target polygon boundary. The one or more target polygons smaller than the minimum feature size are biased to form a digitized pattern on the substrate. Electromagnetic radiation is delivered to reflect off of a first mirror of the DMD when the centroid for the first mirror is within the one or more target polygons.