Docking Station Reference Surface Pivoting Mechanism
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Solution Overview
Problem
Optical surface measuring apparatuses face calibration accuracy issues due to exposure of reference measuring surfaces to environmental factors like dust, light, and mechanical impacts during handling or transport when not in the docking station, leading to undesirable changes that distort reference measurements.
Innovation Solution
A docking station with a reference measuring surface that can be moved into covered and uncovered states, using a pivoting mechanism with a lever system and potentially a cover, to protect the surface from environmental influences and ensure accurate calibration when needed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the reference measuring surface is left exposed in the docking station, then it is accessible for calibration measurements, but it becomes vulnerable to environmental damage from dust, light, and mechanical impacts
Solution Approach 1:
The reference measuring surface is segmented from the main docking station structure by being mounted on a movable carrier that can be pivoted between exposed and covered positions. This segmentation allows the reference surface to be physically separated from the harmful environment while remaining part of the docking station system.
Solution Approach 2:
The reference measuring surface is made dynamic through the pivoting mechanism, transitioning from a static exposed state to a dynamic state where it can be moved into a covered position for protection and back to exposed position for measurements. This dynamic capability resolves the contradiction between accessibility and protection.
2Object-affected harmful factors
If the reference measuring surface is covered to protect it from environmental factors, then calibration accuracy is maintained, but it becomes inaccessible for calibration measurements
Solution Approach 1:
The pivoting mechanism enables the reference measuring surface to dynamically transition between covered and exposed states, allowing easy access for calibration when needed while providing protection during storage or transport.
Solution Approach 2:
The system can be designed to automatically pivot the reference measuring surface into the exposed position when the docking station detects that a surface measuring apparatus is present and requires calibration, and automatically return it to the covered position afterward, making the protection and accessibility functions self-regulating.
3Object-affected harmful factors
If the reference measuring surface is made movable between covered and uncovered states, then it can be protected when not in use, but the device complexity increases
Solution Approach 1:
The protection function is segmented from the main docking station body by using a separate movable carrier assembly. This modular approach adds protection capability while keeping the added complexity localized to a specific subsystem rather than affecting the entire device.
Solution Approach 2:
The cover for the reference measuring surface can be implemented as a thin, flexible panel or door that pivots on simple hinges, providing effective protection with minimal structural complexity. This approach avoids the need for complex rigid enclosures or multiple moving parts.
Data Source
AI summary
The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.