DOE Optical Testing for Multi-Angle Waveguide Inspection
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Solution Overview
Problem
Existing optical inspection methods for optical workpieces, such as waveguides in AR/VR devices, are inefficient and costly due to the use of mechanical systems for adjusting illumination angles, limiting the ability to accurately measure parameters like MTF, PSF, and chromatic aberrations.
Innovation Solution
An optical testing device utilizing a laser light source and a diffractive optical element (DOE) to shape and deflect light beams, combined with a flexible beam shaping unit and detector system, allowing for rapid adjustment of illumination angles and patterns to measure optical properties.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If mechanical systems are used to adjust illumination angles, then the optical workpiece can be illuminated at different angles, but the device complexity and measurement time increase
Solution Approach 1:
The patent replaces mechanical adjustment systems with a diffractive optical element that uses diffraction physics to achieve angle-diversified illumination. The DOE creates multiple diffraction orders that naturally provide light at different angles without any mechanical moving parts, directly resolving the contradiction between adaptability and device complexity.
Solution Approach 2:
The patent changes the illumination parameter from mechanical angle adjustment to optical diffraction angle control. By using a DOE with specific diffraction patterns, the system achieves multiple illumination angles through optical parameter control rather than mechanical parameter adjustment, reducing complexity while maintaining versatility.
2Adaptability or versatility
If mechanical systems are used to adjust illumination angles, then different illumination patterns can be achieved, but the measurement time and cost increase
Solution Approach 1:
The patent replaces time-consuming mechanical adjustment systems with an instantaneous optical diffraction system. The DOE generates multiple illumination patterns simultaneously through diffraction, eliminating the need for sequential mechanical adjustments and significantly reducing measurement time while maintaining pattern diversity.
Solution Approach 2:
The patent prepares multiple illumination patterns in advance by designing the DOE structure to inherently produce various diffraction orders. This preliminary optical configuration allows all required illumination patterns to be available immediately without time-consuming adjustments during measurement, reducing measurement time while maintaining versatility.
3Measurement precision
If multiple illumination angles are used to measure optical parameters, then measurement accuracy improves, but device complexity and measurement time increase
Solution Approach 1:
The patent replaces complex mechanical adjustment systems with a diffractive optical element that provides multi-angle illumination through diffraction physics. This maintains measurement precision by illuminating the workpiece at multiple angles simultaneously while dramatically reducing device complexity by eliminating mechanical actuators and control systems.
Solution Approach 2:
The patent makes the illumination system universal by using a DOE that can generate multiple diffraction orders corresponding to different illumination angles from a single optical component. This multi-functional approach maintains measurement precision across multiple angles without requiring separate adjustment mechanisms for each angle, reducing overall system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and accurate measurement of optical parameters like MTF, PSF, and chromatic aberrations by simplifying the adjustment of illumination angles and patterns, reducing measurement time and cost.
Implementation Method 1
diffraction effects are used to deflect the light, which strikes this optical element at a predetermined wavelength, at a certain angle
Data Source
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AI summary
Disclosed is an optical testing device (100) having a light source (105) for emitting a light beam (110) and a beam shaping unit (115) with a diffractive optical element (DOE, 120) for shaping the light beam (110) and directing it onto a coupling-in area (125) of an optical workpiece (130) for coupling the shaped light into the optical workpiece (130) to be inspected. Furthermore, the optical testing device (100) has a workpiece holding element (135) for holding the optical workpiece (130) and a detector (145) for evaluating light (110) emerging from the coupling-out area (140) of the optical workpiece (130) in order to inspect an optical property of the workpiece (130).