Doped Semiconductor Beam Dump and Power Meter for FSOC Laser Monitoring
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Solution Overview
Problem
Free-space optical communication systems face challenges in protecting sensitive components from unintentionally scattered or deflected high-powered light, which can cause overheating or damage, and require efficient power measurement to ensure system operability.
Innovation Solution
Implementing a beam dump assembly with a doped semiconductor prism to absorb excess laser energy and a power meter to measure and compare power levels, ensuring proper system operation by disabling or reducing power when readings are not as expected.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If high-powered laser beams are used for free-space optical communication, then data transmission rate and capacity are improved, but sensitive components become vulnerable to overheating and damage from scattered or deflected light
Solution Approach 1:
The patent applies the principle of converting harm into benefit by using the scattered and deflected laser light, which would normally be harmful to sensitive components, as a useful signal for power measurement. The beam dump assembly captures this previously harmful scattered light and redirects it to a power meter, transforming it into a beneficial measurement tool that monitors system performance without exposing components to damage.
Solution Approach 2:
The patent introduces an intermediary system consisting of the beam dump assembly and power meter that acts as a mediator between the high-powered laser beam and sensitive components. This intermediary captures scattered light through the beam dump, measures its power level, and provides feedback to control the laser output, thereby protecting sensitive components while maintaining high data transmission rates.
2Reliability
If power measurement is performed to monitor laser output, then system reliability is improved, but additional components and complexity are required
Solution Approach 1:
The patent applies multi-functionality by designing the beam dump assembly to serve multiple purposes: it acts as both a protective element that captures scattered light and a power measurement device. The same optical path and components used for protecting sensitive components from scattered light are utilized for measuring laser power, eliminating the need for separate dedicated power measurement equipment and reducing overall system complexity.
Solution Approach 2:
The system performs self-monitoring by using the beam dump assembly to capture and measure scattered laser light, providing real-time feedback on laser output power. This self-service mechanism allows the system to automatically adjust laser parameters and maintain reliable operation without requiring external monitoring equipment, thereby improving reliability while minimizing added complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The beam dump assembly effectively prevents damage to sensitive components and ensures reliable power measurement, maintaining system integrity by absorbing excess energy and adjusting operations based on power readings.
Implementation Method 1
a beam dump assembly with a doped semiconductor prism to absorb excess laser energy
Implementation Method 2
for reflecting a second portion of the collimated light beam to a power meter
Data Source
AI summary
The present disclosure is directed to a beam dump for trapping and absorbing a first portion of a laser beam, and for reflecting a second portion of the laser beam to a power meter to estimate power of the laser beam in a free-space optical communication (FSOC) terminal. The beam dump can encounter the laser beam as an artifact that was passed through, reflected, or deflected by another component of the FSOC terminal, such as at an antireflection coating. The beam dump can trap and absorb a first portion of the laser beam (e.g., through total internal reflection and its doped semiconductor qualities), while the antireflection coating can reflect the second portion of the laser beam (e.g., 1%) to the power meter. In some implementations, multiple beam dump-power meters assemblies can be included in the FSOC terminal for comparison of measurements and to ensure operability of the FSOC terminal.