Double Encapsulation Ring for Wafer Alignment

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Solution Overview

Problem

The fabrication of electronic devices with stacked assemblies of base wafers, integrated circuit chips, and protection wafers is challenging due to difficulties in aligning the front face of the encapsulation block with the protection wafer, leading to inefficiencies in the collective fabrication process.

Innovation Solution

A process involving the formation of stacked assemblies with channels between them, followed by the deposition and hardening of a first encapsulation ring with protruding beading, and a second encapsulation ring filling the grooves created by the first ring, allowing for precise encapsulation and dicing of individual electronic devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a single encapsulation block is formed around stacked assemblies, then the front face of the encapsulation block can be aligned with the protection wafer, but fabrication difficulties arise that prevent proper alignment

Engineering Contradiction:
Improvealignment precisionVSAvoidfabrication difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The encapsulation block is divided into multiple separate encapsulation rings, each independently formable around individual stacked assemblies. This segmentation allows each ring to be precisely positioned and formed without the fabrication difficulties associated with creating a single large encapsulation block, while still achieving the desired alignment precision with protection wafers.

Inventive Principle:
Principle #1Segmentation

2Productivity

If stacked assemblies are formed with channels between them, then collective fabrication is enabled, but the encapsulation structure becomes more complex

Engineering Contradiction:
Improvecollective fabrication efficiencyVSAvoidencapsulation structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The encapsulation structure is segmented into multiple rings corresponding to the channels between stacked assemblies. This allows collective fabrication processes to treat multiple assemblies simultaneously while maintaining the ability to precisely encapsulate each individual assembly, balancing productivity gains with manageable structural complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The encapsulation rings serve multiple functions: they provide mechanical support, enable collective fabrication handling, define cutting paths for dicing operations, and protect the stacked assemblies. This multi-functionality reduces the need for additional separate structures, managing overall device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Volume of moving object

If the protection wafer is placed close to the chip, then the device size is reduced, but stress on the stacked assembly increases

Engineering Contradiction:
Improvedevice sizeVSAvoidstress on stacked assembly
Core Design Contradiction:
Volume of moving objectVSStress or pressure

Solution Approach 1:

The encapsulation rings provide localized mechanical support and stress distribution at critical interfaces between the protection wafer and chip. This allows the protection wafer to be positioned closer to the chip for compact device size while the encapsulation structure locally manages the stress, preventing excessive stress on the stacked assembly.

Inventive Principle:
Principle #3Local quality

4Stress or pressure

If a deformable material is used for the first encapsulation ring, then stress is minimized during dicing, but the material selection becomes more constrained

Engineering Contradiction:
Improvestress during dicingVSAvoidmaterial selection flexibility
Core Design Contradiction:
Stress or pressureVSAdaptability or versatility

Solution Approach 1:

The first encapsulation ring is formed from a deformable material whose mechanical properties can be adjusted through parameter changes such as cross-linking density, filler content, or curing conditions. This allows optimization of the material's deformability to minimize stress during dicing operations while maintaining other required properties like adhesion and structural support.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables efficient collective fabrication of electronic devices with precise encapsulation, minimizing stress on the stacked assemblies and allowing for the preservation of a free space between the chip and protection wafer, facilitating the integration of sensors and maintaining the structural integrity of the device.

Implementation Method 1

depositing a first coating material within the channels and hardening this first coating material so as to form a first encapsulation ring

Methodology Applied
Scientific EffectDeposition: Deposition (physical)

Implementation Method 2

injecting a second coating material into the recessed grooves and hardening this second coating material so as to form a second encapsulation ring

Methodology Applied
Scientific EffectDeposition: Deposition (physical)

Data Source

PatentUS9472692B2Process of fabrication of electronic devices and electronic device with a double encapsulation ring
Publication Date: 2016.10.18 STMICROELECTRONICS (GRENOBLE 2) SAS
  • US9472692B2 patent drawing
  • US9472692B2 patent drawing
  • US9472692B2 patent drawing

AI summary

An integrated circuit chip is mounted on top of a base wafer, and a protection wafer is mounted on top of the integrated circuit chip. An encapsulation block is formed around the integrated circuit chip and the protection wafer and on a peripheral part of the front face of the base wafer. The encapsulation block includes a first encapsulation ring arranged around the integrated circuit chip and the protection wafer, having an annular beading protruding with respect to the front face of the protection wafer and forming a peripheral groove (24) recessed with respect to this protruding annular beading. A second encapsulation ring of the encapsulation block fills the peripheral groove of the first encapsulation ring.