Double-Layer 2D Material Structure for Bandgap and Contact Control

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Solution Overview

Problem

Current semiconductor manufacturing faces challenges with miniaturization, including heat dissipation, leakage current, noise, and interference, which require new materials or structures that can handle miniaturization processes, gate control, and conductive properties of semiconductors.

Innovation Solution

The development of an artificial double-layer 2D material with a specific layered atomic structure, comprising transition metals and heterogeneous atoms, bound by chemical bonding and van der Waals forces, which is manufactured using a novel synthesis platform and precise control of atom layer removal.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If single-layer 2D materials are used, then the structure is simple and manufacturing is easier, but the electrical characteristics and energy gap controllability are insufficient

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidelectrical characteristics
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent employs composite 2D material structures combining different atomic layers (e.g., TMD layers with graphene or h-BN layers) to achieve superior electrical characteristics and energy gap controllability while maintaining manufacturing feasibility through established CVD techniques

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If conventional 2D materials are used, then the manufacturing process is established, but the contact resistance is high and on-state current is limited

Engineering Contradiction:
Improvemanufacturing process maturityVSAvoidcontact resistance control
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent implements local quality enhancement by introducing specific atomic layers (such as metallic TMD phases or doped regions) at contact interfaces to reduce contact resistance, while maintaining the overall structure compatible with established manufacturing processes

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent utilizes parameter changes by controlling the phase, composition, and thickness of atomic layers to optimize electrical properties including contact resistance and on-state current, achieving better performance within existing manufacturing frameworks

Inventive Principle:
Principle #35Parameter changes

3Length of moving object

If 2D materials are miniaturized for advanced semiconductor applications, then the device size is reduced, but heat dissipation and leakage current issues worsen

Engineering Contradiction:
Improvedevice sizeVSAvoidheat dissipation
Core Design Contradiction:
Length of moving objectVSTemperature

Solution Approach 1:

The patent employs composite structures with materials having complementary thermal and electrical properties, such as combining TMD layers with high thermal conductivity materials like graphene or h-BN, to improve heat dissipation in miniaturized devices while maintaining low leakage current characteristics

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This artificial double-layer 2D material exhibits improved electrical characteristics, increased energy gap controllability, lower contact resistance, and enhanced on-state current compared to conventional single-layer 2D materials, making it suitable for advanced semiconductor applications.

Implementation Method 1

atoms of the first layered atomic structure and the second layered atomic structure are bound by chemical bonding

Methodology Applied
Scientific EffectChemical bonding: Chemical Bonding

Implementation Method 2

the first layered atomic structure and the second layered atomic structure are bound by van der Waals forces

Methodology Applied
Scientific EffectVan der Waals forces: Van der Waals Force

Data Source

PatentUS20250040209A1Artificial double-layer two-dimensional material and method of manufacturing same
Publication Date: 2025.01.30 NAT CENT UNIV
  • US20250040209A1 patent drawing
  • US20250040209A1 patent drawing
  • US20250040209A1 patent drawing

AI summary

An artificial double-layer two-dimensional material includes a first layered atomic structure and a second layered atomic structure. The first layered atomic structure includes a first middle atomic layer, a first lower atomic layer, and a first upper atomic layer. The first lower and the first upper atomic layers are disposed on lower and upper surfaces of the first middle atomic layer respectively. The second layered atomic structure includes a second middle atomic layer, a second lower atomic layer, and a second upper atomic layer. The second lower and the second upper atomic layers are disposed on lower and upper surfaces of the second middle atomic layer respectively. The first middle atomic layer and the second middle atomic layer are two-dimensional planar atomic structures formed of transition metals. The first lower and the first upper atomic layers are 2D planar atomic structures formed of heterogeneous atom.