Double Metal Layer Etching Composition for TFT-LCD Array Substrates

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Solution Overview

Problem

The existing etching methods for double metal layers of aluminum neodymium (AlNd) and molybdenum (Mo) in TFT-LCD devices face challenges such as overhang structures, molybdenum tails, and aluminum neodymium residues, leading to electrical shorts, image stains, and non-uniform profiles due to differences in etch rates and poor wettability.

Innovation Solution

A composition comprising 63.5% to 64.5% phosphoric acid, 8% to 9% nitric acid, 8% to 12% acetic acid, and an anionic additive is used to etch the double metal layer, ensuring uniformity and preventing defects like overhangs and residues.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single etchant is used to etch both aluminum neodymium and molybdenum layers, then the etching process is simplified, but non-uniform etching rates cause overhang structures and poor profile uniformity

Engineering Contradiction:
Improveetching process complexityVSAvoiddouble metal line profile uniformity
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The patent modifies the chemical composition parameters of the etchant by adding specific organic additives (carboxylic acid and alcohol) to the phosphoric acid-based etchant. This parameter change enables simultaneous etching of AlNd and Mo layers with uniform rates, resolving the contradiction between process simplicity and profile uniformity without requiring multiple etching steps

Inventive Principle:
Principle #35Parameter changes

2Reliability

If aluminum neodymium layer is over-etched to remove residues, then complete pattern formation is achieved, but molybdenum layer is damaged and overhang structures are created

Engineering Contradiction:
Improvepattern formation completenessVSAvoidoverhang structure and electrical short
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent introduces organic intermediary substances (carboxylic acid and alcohol additives) that mediate the etching reaction between the etchant and metal layers. These intermediaries modify the etching mechanism to achieve uniform removal of both AlNd and Mo layers simultaneously, preventing both over-etching damage and residue formation without creating overhang structures

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If aluminum neodymium layer has poor wettability, then etching is incomplete and residues remain, but increasing etching aggressiveness damages the molybdenum layer

Engineering Contradiction:
Improveetching completenessVSAvoidaluminum neodymium residue
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The patent changes the chemical parameters of the etchant by incorporating carboxylic acid and alcohol additives that improve wettability on aluminum neodymium surfaces. This enables complete etching of the AlNd layer without requiring aggressive etching conditions that would damage the underlying molybdenum layer, thus eliminating residues while preserving layer integrity

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution achieves a uniform double metal line without molybdenum tails or aluminum neodymium residues, improving display device resolution, preventing electrical issues, and eliminating image stains.

Implementation Method 1

a composition for etching a double metal layer includes: about 63.5% to about 64.5% by weight of a phosphoric acid; about 8% to about 9% by weight of a nitric acid; about 8% to about 12% by weight of an acetic acid; and an anionic additive

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Data Source

PatentUS7662725B2Composition for etching double metal layer, method of fabricating array substrate using the composition, and method of forming double metal line using the composition
Publication Date: 2010.02.16 LG DISPLAY CO LTD
  • US7662725B2 patent drawing
  • US7662725B2 patent drawing
  • US7662725B2 patent drawing

AI summary

A composition for etching a double metal layer, a method of fabricating an array substrate using the composition, and a method of forming a double metal line using the composition are provided. The composition includes about 63.5% to about 64.5% by weight of a phosphoric acid; about 8% to about 9% by weight of a nitric acid; about 8% to about 12% by weight of an acetic acid; and an anionic additive.