Automated Double Pulse Testing for WBG Device Validation
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Solution Overview
Problem
The existing methods for testing Wide Band Gap (WBG) semiconductor devices are time-consuming, error-prone, and lack standardization, leading to delays in validation and reduced confidence in test results due to manual data analysis and varied setups.
Innovation Solution
An automated Double Pulse Test (DPT) system with reverse recovery plot for system validation of WBG power devices, utilizing industry-leading probes and standardized workflows for accurate, efficient, and flexible in-circuit testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual DPT testing and analysis is performed, then flexibility in customizing test procedures is maintained, but testing time increases significantly and error rates increase
Solution Approach 1:
The automated DPT system performs self-service by automatically configuring test parameters, executing measurements, analyzing waveforms, and generating reports without requiring manual intervention. The system includes built-in libraries of test sequences and analysis algorithms that automatically adapt to different WBG device types, enabling the system to serve its own testing needs while maintaining flexibility through programmable customization options.
Solution Approach 2:
The patent replaces manual mechanical operations with automated electronic systems. Instead of manually configuring instruments, adjusting probes, analyzing waveforms, and documenting results, the system uses computer-controlled automation to perform all these functions electronically. This substitution eliminates human error and dramatically increases testing throughput while maintaining the ability to customize test procedures through software configuration.
2Adaptability or versatility
If manual waveform analysis and reporting is performed, then customization of analysis methods is possible, but time consumption increases and result accuracy decreases
Solution Approach 1:
The system performs preliminary action by pre-configuring analysis algorithms and measurement sequences before actual testing begins. Libraries of standardized analysis methods for switching parameters, diode reverse recovery, gate charge, and capacitance are prepared in advance. During testing, these pre-programmed algorithms automatically process waveforms and generate results, eliminating the need for manual analysis while maintaining the ability to customize methods through software selection and configuration.
Solution Approach 2:
The patent uses copying by creating digital replicas of test procedures and analysis methods that can be repeatedly executed without manual intervention. Once a test sequence or analysis algorithm is programmed, it can be copied and applied to multiple devices or reused across different test scenarios. This digital copying enables consistent, repeatable measurements while dramatically reducing the time required for each subsequent test.
3Adaptability or versatility
If varied company-specific test setups are used, then specific company requirements can be met, but result correlation and confidence in tests decrease
Solution Approach 1:
The automated DPT system achieves universality by designing a multi-functional platform that can accommodate different WBG device types (MOSFETs, IGBTs, diodes), various test configurations, and multiple analysis methods through a single standardized instrument. The system includes configurable parameters and adaptable measurement sequences that can be customized for different company requirements while maintaining a consistent core measurement methodology. This universal design enables result correlation across different devices and manufacturers while still allowing customization for specific application needs.
Data Source
AI summary
A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface. A method of automatically performing a double pulse test and analysis on a device under test (DUT) includes receiving a user input through a user interface on a test and measurement instrument, the user input to identify at least one analysis to be performed on waveform data received from the DUT, receiving the waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and a second pulse or multiple pulses from a source instrument, performing the analysis on the waveform data, and displaying the waveform data and analysis on the user interface.