Double Tilt TEM Sample Holder for In-Situ Nanomaterial Deformation
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Solution Overview
Problem
Current TEM sample holders are limited in their ability to perform in-situ dynamic studies of material deformation at atomic scale due to restricted tilting capabilities and the inability to apply stress simultaneously during double tilt conditions, which hinders the understanding of deformation mechanisms and phase changes in nanomaterials.
Innovation Solution
A double tilt transmission electron microscope (TEM) sample holder design that allows tilting around both X and Y axes, equipped with a sensor system for real-time mechanical and electrical property measurement, enabling in-plane stress loading and monitoring through a sophisticated structural arrangement with a sensor carrier, supporting shafts, and conductor wires.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If single tilt condition is used for in-situ deformation study, then simple sample holder design is maintained, but observation resolution and measurement precision are limited
Solution Approach 1:
The sample holder incorporates dynamic tilting capabilities with independent X-axis and Y-axis rotation, allowing the sample to be oriented at optimal angles for high-resolution observation during in-situ deformation experiments. This dynamic adjustment enables maintaining atomic-scale resolution while applying stress, overcoming the limitations of fixed or single-axis tilt designs.
2Ease of operation
If commercial TEM sample holders are used for in-situ study, then ease of operation is improved, but the ability to simultaneously apply stress under double tilt condition is lost
Solution Approach 1:
The sample holder is designed as a multi-functional integrated system that combines stress application capabilities with double tilt functionality in a single device. It can apply stress along different crystallographic directions while simultaneously tilting around both X and Y axes, eliminating the need to switch between different specialized holders and enabling comprehensive in-situ deformation studies under various loading conditions.
Data Source
AI summary
A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical/electrical parameters concurrently.