High-Throughput dPCR Chip With Valve-Isolated Reaction Chambers

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Solution Overview

Problem

Existing digital PCR (dPCR) technologies face challenges in ensuring high-throughput testing with accurate quantification and minimizing contamination between reaction chambers, particularly in flexible and efficient sample liquid management.

Innovation Solution

A high-throughput test chip design featuring a backplane and cover plate with accommodation chambers, each equipped with a test chip unit, liquid inlets and outlets, and a connector with pipelines and valve structures allowing flexible selection and control of sample liquid distribution, preventing contamination by isolating unused chambers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple accommodation chambers are used for high-throughput testing, then test throughput is improved, but contamination risk between chambers increases

Engineering Contradiction:
Improvetest throughputVSAvoidcontamination risk
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The system divides the fluid control into multiple independent pipeline groups, where each group serves specific accommodation chambers. Valve structures are segmented to control each pipeline independently, allowing selective activation of chambers while isolating others, thus preventing cross-contamination while maintaining high throughput capability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The valve structures enable dynamic control of pipeline connections, allowing the system to adaptively configure which accommodation chambers are active during each test cycle. This dynamic isolation ensures that only used chambers receive sample liquid, eliminating contamination risk to idle chambers while preserving high-throughput functionality

Inventive Principle:
Principle #15Dynamics

2Object-affected harmful factors

If valve structures are added to control sample liquid distribution, then contamination prevention is improved, but device complexity increases

Engineering Contradiction:
Improvecontamination preventionVSAvoiddevice complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

Instead of providing individual valve control for every single pipeline connection, the system implements valve structures at strategic points in the pipeline groups. This partial control approach is sufficient to isolate accommodation chambers when needed, achieving contamination prevention without the excessive complexity of full individual control

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The valve structures serve multiple functions: they control sample liquid flow distribution, isolate idle accommodation chambers, and enable flexible configuration of active test chambers. This multi-functionality reduces the need for additional specialized components, thereby limiting the increase in device complexity while achieving comprehensive contamination prevention

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Productivity

If pipeline groups with shared outlets are used, then sample liquid management efficiency is improved, but control precision over individual chambers decreases

Engineering Contradiction:
Improvesample liquid management efficiencyVSAvoidcontrol precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The shared outlet pipelines are equipped with valve structures that enable dynamic control of sample liquid distribution. Although pipelines share common outlets, the valves allow precise routing of sample liquid to specific accommodation chambers based on test requirements, maintaining control precision while benefiting from the efficiency of shared pipeline infrastructure

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12515217B2High-throughput test chip
Publication Date: 2026.01.06 BEIJING BOE TECH DEV CO LTD
  • US12515217B2 patent drawing
  • US12515217B2 patent drawing
  • US12515217B2 patent drawing

AI summary

A high-throughput test chip includes: a backplane, a cover plate and a connector. The backplane and the cover plate are aligned to form a plurality of accommodation chambers. Test chip units are disposed on one side of the backplane facing the cover plate, and each of the test chip units is located in the corresponding accommodation chamber. Each of the accommodation chambers is provided with a liquid inlet and a liquid outlet. The connector includes pipelines; each of the pipelines is provided with a valve structure configured to control connection or disconnection of the pipeline. In each pair of a pipeline and an accommodation chamber, an inlet of the pipeline communicates with the liquid outlet of the accommodation chamber; the pipelines form at least one pipeline group, each pipeline group at least includes two pipelines, and the pipelines in each pipeline group share the same sample liquid outlet.