Multi-rank SDRAM Control Using DQM for Rank Selection

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Solution Overview

Problem

Conventional multi-rank SDRAM configurations face performance degradation due to wait times required to avoid conflicts between ranks and waste unused data bits in SDRAM devices, especially when parity or ECC bit width is narrower than the data port width.

Innovation Solution

The use of DQM (data mask signal) instead of CS# (chip select signal) for rank selection, allowing byte-wise data masking and reducing the number of SDRAM devices needed for parity/ECC, thereby eliminating performance penalties and minimizing waste.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If CS# (chip select signal) is used for rank selection in multi-rank SDRAM configuration, then rank access control is achieved, but wait time is required to avoid conflicts between ranks causing performance degradation

Engineering Contradiction:
Improverank access controlVSAvoiddata access speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments the data mask signal DQM into multiple independent signals (DQM0-DQM7) corresponding to different byte lanes. Each DQM signal can independently mask data for specific byte lanes, allowing simultaneous access to multiple ranks without conflict by selectively masking only the necessary byte lanes during each transaction.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the control parameter from chip select signal CS# to data mask signal DQM for rank selection. This parameter change allows byte-wise masking capability where only specific byte lanes are masked during each memory access, enabling fine-grained control over which rank is accessed without requiring global rank selection that causes conflicts.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If conventional CS# based rank control is used, then multi-rank configuration is achieved, but unused data bits remain wasted in SDRAM devices for parity/ECC

Engineering Contradiction:
Improvemulti-rank configurationVSAvoidunused data bits
Core Design Contradiction:
Adaptability or versatilityVSLoss of substance

Solution Approach 1:

The patent applies local quality by enabling different masking states for different byte lanes within the same SDRAM device. Byte lanes 0-7 can be selectively masked using DQM0-DQM7 signals, allowing the lower-order byte lanes to be used for parity/ECC while upper-order byte lanes remain available for additional rank capacity, optimizing resource utilization at the byte-lane level.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent makes the SDRAM device universally applicable by allowing the same device to serve multiple functions: data storage in some byte lanes and parity/ECC storage in other byte lanes. The byte-wise masking capability enables a single SDRAM device to fulfill both data and parity/ECC roles simultaneously, eliminating the need for separate dedicated parity/ECC devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10474393B2Multi-rank SDRAM control method and SDRAM controller
Publication Date: 2019.11.12 FANUC LTD
  • US10474393B2 patent drawing
  • US10474393B2 patent drawing
  • US10474393B2 patent drawing

AI summary

To provide a multi-rank SDRAM control method and an SDRAM controller that prevent performance degradation and minimize increase in parts count even in a multi-rank SDRAM configuration. A multi-rank SDRAM control method controls a multi-rank SDRAM formed by connecting data buses of multiple SDRAM devices. In each of the multiple SDRAM devices, only a data mask signal for a rank of the SDRAM device, which is to be accessed, is negated, whereby an access to the rank is executed.