DRAM Codeword Decoding for Counterfeit Detection and Self-Test

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Solution Overview

Problem

Dynamic random access memory (DRAM) systems face challenges with reliability availability serviceability (RAS) due to performance changes over time and increased error occurrence during manufacturing and operation, necessitating effective counterfeit detection and proper functioning verification.

Innovation Solution

A memory device and test system that detects illegal codewords, converts them into fixed patterns, and compares with input data to verify authenticity and functionality, utilizing a decoder group, memory cell array, and encoder to decode and encode codewords, reducing implementation area and power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional DRAM testing methods are used, then manufacturing and operational errors can be detected, but the system cannot reliably detect counterfeit DRAM and verify authenticity

Engineering Contradiction:
Improvecounterfeit detection capabilityVSAvoidtest system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-configuring the memory device with specific encoding/decoding functionality that enables counterfeit detection. The encoder and decoder are built into the memory device itself before testing, allowing authenticity verification to be performed as part of the normal operation rather than requiring complex external test equipment.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The memory device's encoder and decoder serve multiple functions: they encode/decode normal data patterns for storage operations, and simultaneously encode/decode test patterns for counterfeit detection. This multi-functionality eliminates the need for separate dedicated testing hardware, reducing overall system complexity while maintaining reliable counterfeit detection capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If comprehensive testing is performed to verify DRAM functionality, then operational errors can be detected, but power consumption and implementation area increase

Engineering Contradiction:
Improveoperational verification accuracyVSAvoidtest device power consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The memory device performs its own self-testing by using its internal encoder and decoder to process test patterns. The device encodes test patterns, stores them in the memory cell array, reads them back, and decodes them for verification. This self-service approach eliminates the need for power-hungry external test equipment, significantly reducing power consumption while maintaining comprehensive operational verification.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent merges the testing functionality with the normal data processing pathways by using the same encoder, decoder, and memory cell array for both operational data and test patterns. This consolidation eliminates redundant hardware components and reduces overall power consumption while maintaining the ability to perform comprehensive functional verification.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If detailed codeword analysis is performed to detect illegal patterns, then counterfeit detection accuracy improves, but processing time increases

Engineering Contradiction:
Improveillegal codeword detection accuracyVSAvoidtest processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces complex mechanical or software-based analysis systems with an optimized hardware decoding circuit. The decoder is specifically designed to efficiently identify illegal codeword patterns through dedicated logic that directly compares decoded patterns against valid patterns, providing high detection accuracy without the time overhead of software-based analysis.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS12431209B2Memory devices, operating methods of the memory devices, and test systems including the memory devices
Publication Date: 2025.09.30 SAMSUNG ELECTRONICS CO LTD
  • US12431209B2 patent drawing
  • US12431209B2 patent drawing
  • US12431209B2 patent drawing

AI summary

A memory device, an operating method of the memory device, and a test system including the memory device. The memory device may include a decoder group configured to receive a plurality of codewords including a plurality of symbols from outside of the memory device and to decode the plurality of codewords into data patterns, a memory cell array configured to store the data patterns received from the decoder group and including a plurality of memory cells, and an encoder configured to encode the data patterns into the plurality of codewords including the plurality of symbols. The plurality of codewords may include illegal codewords and normal codewords, and the decoder group may be further configured to convert the illegal codewords among the plurality of codewords into fixed patterns, and the encoder may be configured to output the plurality of codewords to the outside of the memory device.