DRAM Built-In Self-Test via Programmable Fault Injection
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Solution Overview
Problem
Current methods for testing dynamic random access memory (DRAM) modules under fault conditions are expensive and time-consuming, as they require manual administration and result in the disposal of tested modules, which limits their integration into production.
Innovation Solution
Incorporating a mode register in DRAM modules connected to a memory controller through a shared address bus, allowing for controlled fault injection into signal lines, enabling built-in self-tests (BISTs) without the need for external test equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual fault injection methods are used (physically cutting pins, soldering pins together, or connecting voltage sources), then fault conditions can be injected into DRAM modules for testing, but the testing process becomes expensive and time-consuming, and tested modules must be discarded
Solution Approach 1:
The patent implements built-in self-test (BIST) functionality within the DRAM module, allowing the module to autonomously perform fault detection without external test equipment. The mode register and test logic are integrated into the DRAM module itself, enabling it to self-diagnose faults through programmable fault injection controlled by the memory controller, thereby eliminating manual testing operations and reducing testing time and costs
Solution Approach 2:
The patent replaces manual mechanical fault injection methods (physically cutting pins, soldering pins together, or connecting voltage sources) with an electronic/software-based approach. The mode register and control logic enable fault injection through electrical signals and programmable configurations rather than physical manipulation, allowing non-destructive testing that eliminates the need to discard tested modules
2Reliability
If manual fault injection methods are used (physically cutting pins, soldering pins together, or connecting voltage sources), then fault conditions can be injected into DRAM modules for testing, but the testing process becomes expensive and time-consuming
Solution Approach 1:
The patent implements built-in self-test (BIST) functionality within the DRAM module, allowing the module to autonomously perform fault detection without external test equipment. The mode register and test logic are integrated into the DRAM module itself, enabling it to self-diagnose faults through programmable fault injection controlled by the memory controller, thereby eliminating manual testing operations and reducing testing time and costs
Solution Approach 2:
The patent replaces manual mechanical fault injection methods (physically cutting pins, soldering pins together, or connecting voltage sources) with an electronic/software-based approach. The mode register and control logic enable fault injection through electrical signals and programmable configurations rather than physical manipulation, allowing non-destructive testing that eliminates the need to discard tested modules
3Reliability
If manual fault injection methods are used, then fault conditions can be injected into DRAM modules for testing, but the tested DRAM module cannot be put into production but must be discarded
Solution Approach 1:
The patent replaces manual mechanical fault injection methods (physically cutting pins, soldering pins together, or connecting voltage sources) with an electronic/software-based approach. The mode register and control logic enable fault injection through electrical signals and programmable configurations rather than physical manipulation, allowing non-destructive testing that eliminates the need to discard tested modules
Solution Approach 2:
The patent implements built-in self-test (BIST) functionality within the DRAM module, allowing the module to autonomously perform fault detection without external test equipment. The mode register and test logic are integrated into the DRAM module itself, enabling it to self-diagnose faults through programmable fault injection controlled by the memory controller, thereby eliminating manual testing operations and reducing testing time and costs
4Reliability
If external test equipment is used for fault injection, then fault conditions can be injected into DRAM modules, but the complexity and cost of testing increases
Solution Approach 1:
The patent extracts the fault injection and test execution functionality from external test equipment and integrates it directly into the DRAM module through the mode register and built-in test logic. This internalization eliminates the need for complex external testing apparatus, reducing system complexity while maintaining comprehensive fault detection capabilities
Solution Approach 2:
The patent implements built-in self-test (BIST) functionality within the DRAM module, allowing the module to autonomously perform fault detection without external test equipment. The mode register and test logic are integrated into the DRAM module itself, enabling it to self-diagnose faults through programmable fault injection controlled by the memory controller, thereby eliminating manual testing operations and reducing testing time and costs
Data Source
AI summary
Fault injection in dynamic random access memory (‘DRAM’) modules for performing built-in self-tests (‘BISTs’) including establishing, in the mode registers of the DRAM modules by the memory controller through the shared address bus, an injection of a fault into one or more signal lines of a DRAM module, the fault characterized by a fault type; writing data by the memory controller through a data bus to the DRAM modules, the data identifying a particular DRAM module; and responsive to receiving the data, injecting, by the particular DRAM module, the fault characterized by the fault type into the one or more signal lines of the particular DRAM module.